Editors:
Buy it now
Buying options
Tax calculation will be finalised at checkout
Other ways to access
This is a preview of subscription content, log in via an institution to check for access.
Table of contents (28 papers)
-
Front Matter
-
Pattern Recognition and System Identification
-
Learning Process and Learning Control
About this book
Editors and Affiliations
-
School of Electrical Engineering, Purdue University, Lafayette, USA
K. S. Fu
Bibliographic Information
Book Title: Pattern Recognition and Machine Learning
Book Subtitle: Proceedings of the Japan—U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18–20, 1970
Editors: K. S. Fu
DOI: https://doi.org/10.1007/978-1-4615-7566-5
Publisher: Springer New York, NY
-
eBook Packages: Springer Book Archive
Copyright Information: Plenum Press, New York 1971
Softcover ISBN: 978-1-4615-7568-9Published: 12 December 2012
eBook ISBN: 978-1-4615-7566-5Published: 06 December 2012
Edition Number: 1
Number of Pages: X, 344
Topics: Pattern Recognition, Artificial Intelligence, Computer Applications in Chemistry