Editors:
- Provides comprehensive review on various reliability mechanisms at sub-45nm nodes
- Describes practical modeling and characterization techniques for reliability
- Includes thorough presentation of robust design techniques for major VLSI design units
- Promotes physical understanding with first-principle simulations
- Includes supplementary material: sn.pub/extras
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Table of contents (12 chapters)
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Front Matter
About this book
Editors and Affiliations
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Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Ricardo Reis, Gilson Wirth
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School of ECEE, Arizona State University, Tempe, USA
Yu Cao
Bibliographic Information
Book Title: Circuit Design for Reliability
Editors: Ricardo Reis, Yu Cao, Gilson Wirth
DOI: https://doi.org/10.1007/978-1-4614-4078-9
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media New York 2015
Hardcover ISBN: 978-1-4614-4077-2
Softcover ISBN: 978-1-4939-4156-8
eBook ISBN: 978-1-4614-4078-9
Edition Number: 1
Number of Pages: VI, 272
Number of Illustrations: 58 b/w illustrations, 132 illustrations in colour
Topics: Circuits and Systems, Quality Control, Reliability, Safety and Risk, Computer-Aided Engineering (CAD, CAE) and Design