Circuit Design for Reliability

Editors: Reis, Ricardo, Cao, Yu, Wirth, Gilson (Eds.)

  • Provides comprehensive review on various reliability mechanisms at sub-45nm nodes
  • Describes practical modeling and characterization techniques for reliability
  • Includes thorough presentation of robust design techniques for major VLSI design units
  • Promotes physical understanding with first-principle simulations
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eBook 86,86 €
price for Spain (gross)
  • ISBN 978-1-4614-4078-9
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 145,59 €
price for Spain (gross)
  • ISBN 978-1-4614-4077-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 106,90 €
price for Spain (gross)
  • ISBN 978-1-4939-4156-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
About this book

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Table of contents (12 chapters)

  • Introduction

    Reis, Ricardo (et al.)

    Pages 1-4

    Preview Buy Chapter 30,19 €
  • Recent Trends in Bias Temperature Instability

    Kaczer, B. (et al.)

    Pages 5-19

    Preview Buy Chapter 30,19 €
  • Charge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability

    Wirth, Gilson (et al.)

    Pages 21-46

    Preview Buy Chapter 30,19 €
  • Atomistic Simulations on Reliability

    Vasileska, Dragica (et al.)

    Pages 47-67

    Preview Buy Chapter 30,19 €
  • On-Chip Characterization of Statistical Device Degradation

    Sato, Takashi (et al.)

    Pages 69-92

    Preview Buy Chapter 30,19 €

Buy this book

eBook 86,86 €
price for Spain (gross)
  • ISBN 978-1-4614-4078-9
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 145,59 €
price for Spain (gross)
  • ISBN 978-1-4614-4077-2
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 106,90 €
price for Spain (gross)
  • ISBN 978-1-4939-4156-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
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Bibliographic Information

Bibliographic Information
Book Title
Circuit Design for Reliability
Editors
  • Ricardo Reis
  • Yu Cao
  • Gilson Wirth
Copyright
2015
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media New York
Distribution Rights
Distribution rights for India: Delhi Book Store, New Delhi, India
eBook ISBN
978-1-4614-4078-9
DOI
10.1007/978-1-4614-4078-9
Hardcover ISBN
978-1-4614-4077-2
Softcover ISBN
978-1-4939-4156-8
Edition Number
1
Number of Pages
VI, 272
Number of Illustrations and Tables
58 b/w illustrations, 132 illustrations in colour
Topics