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Practical Scanning Electron Microscopy

Electron and Ion Microprobe Analysis

Editors: Goldstein, Joseph (Ed.)

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eBook $119.00
price for USA in USD (gross)
  • ISBN 978-1-4613-4422-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $159.99
price for USA in USD
  • ISBN 978-1-4613-4424-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara­ interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Table of contents (14 chapters)

  • Introduction

    Goldstein, J. I. (et al.)

    Pages 1-19

  • Electron Optics

    Goldstein, J. I.

    Pages 21-48

  • Electron Beam-Specimen Interaction

    Goldstein, J. I.

    Pages 49-94

  • Image Formation in the Scanning Electron Microscope

    Newbury, D. E.

    Pages 95-148

  • Contrast Mechanisms of Special Interest in Materials Science

    Newbury, D. E. (et al.)

    Pages 149-210

Buy this book

eBook $119.00
price for USA in USD (gross)
  • ISBN 978-1-4613-4422-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $159.99
price for USA in USD
  • ISBN 978-1-4613-4424-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Practical Scanning Electron Microscopy
Book Subtitle
Electron and Ion Microprobe Analysis
Editors
  • Joseph Goldstein
Copyright
1975
Publisher
Springer US
Copyright Holder
Plenum Press, New York
eBook ISBN
978-1-4613-4422-3
DOI
10.1007/978-1-4613-4422-3
Softcover ISBN
978-1-4613-4424-7
Edition Number
1
Number of Pages
XVIII, 582
Topics