Skip to main content
  • Book
  • © 1990

Computer-Assisted Microscopy

The Measurement and Analysis of Images

Authors:

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

This is a preview of subscription content, log in via an institution to check for access.

Table of contents (14 chapters)

  1. Front Matter

    Pages i-xii
  2. Introduction

    • John C. Russ
    Pages 1-12
  3. Acquiring Images

    • John C. Russ
    Pages 13-32
  4. Image Processing

    • John C. Russ
    Pages 33-69
  5. Segmentation of Edges and Lines

    • John C. Russ
    Pages 71-98
  6. Discrimination and Thresholding

    • John C. Russ
    Pages 99-127
  7. Binary Image Editing

    • John C. Russ
    Pages 129-174
  8. Image Measurements

    • John C. Russ
    Pages 175-220
  9. Object Recognition

    • John C. Russ
    Pages 267-308
  10. Surface Image Measurements

    • John C. Russ
    Pages 309-349
  11. Stereoscopy

    • John C. Russ
    Pages 351-376
  12. Serial Sections

    • John C. Russ
    Pages 377-418
  13. Tomography

    • John C. Russ
    Pages 419-437
  14. Lessons from Human Vision

    • John C. Russ
    Pages 439-450
  15. Back Matter

    Pages 451-453

About this book

The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.

Authors and Affiliations

  • North Carolina State University, Raleigh, USA

    John C. Russ

Bibliographic Information

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access