SpringerBriefs in Electrical and Computer Engineering

Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Authors: Bou-Sleiman, Sleiman, Ismail, Mohammed

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  • Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi.
  • SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mm.
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eBook $54.99
price for USA in USD
  • ISBN 978-1-4419-9548-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $69.99
price for USA in USD
  • ISBN 978-1-4419-9547-6
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
About this book

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 

Table of contents (6 chapters)

Table of contents (6 chapters)
  • Introduction and Motivation

    Pages 1-12

    Bou-Sleiman, Sleiman (et al.)

  • Radio Systems Overview: Architecture, Performance, and Built-in-Test

    Pages 13-34

    Bou-Sleiman, Sleiman (et al.)

  • Efficient Testing for RF SoCs

    Pages 35-55

    Bou-Sleiman, Sleiman (et al.)

  • RF Built-in-Self-Test

    Pages 57-71

    Bou-Sleiman, Sleiman (et al.)

  • RF Built-in-Self-Calibration

    Pages 73-86

    Bou-Sleiman, Sleiman (et al.)

Buy this book

eBook $54.99
price for USA in USD
  • ISBN 978-1-4419-9548-3
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Softcover $69.99
price for USA in USD
  • ISBN 978-1-4419-9547-6
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Authors
Series Title
SpringerBriefs in Electrical and Computer Engineering
Copyright
2012
Publisher
Springer-Verlag New York
Copyright Holder
Springer Science+Business Media, LLC
eBook ISBN
978-1-4419-9548-3
DOI
10.1007/978-1-4419-9548-3
Softcover ISBN
978-1-4419-9547-6
Series ISSN
2191-8112
Edition Number
1
Number of Pages
XVII, 89
Number of Illustrations
70 b/w illustrations
Topics