Authors:
- Applies Built-in-Self-Test (Bi. ST) and Built-in-Self-Calibration (Bi.
- SC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mm.
Part of the book series: SpringerBriefs in Electrical and Computer Engineering (BRIEFSELECTRIC)
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Table of contents (6 chapters)
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Front Matter
About this book
Authors and Affiliations
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The Ohio State University, Columbus, USA
Sleiman Bou-Sleiman
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, Dpt. of Electrical & Computer Engineerin, The Ohio State University, Columbus, USA
Mohammed Ismail
Bibliographic Information
Book Title: Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Authors: Sleiman Bou-Sleiman, Mohammed Ismail
Series Title: SpringerBriefs in Electrical and Computer Engineering
DOI: https://doi.org/10.1007/978-1-4419-9548-3
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media, LLC 2012
Softcover ISBN: 978-1-4419-9547-6Published: 22 September 2011
eBook ISBN: 978-1-4419-9548-3Published: 23 September 2011
Series ISSN: 2191-8112
Series E-ISSN: 2191-8120
Edition Number: 1
Number of Pages: XVII, 89
Number of Illustrations: 70 b/w illustrations
Topics: Circuits and Systems, Signal, Image and Speech Processing, Electronic Circuits and Devices