Analysis and Design of Resilient VLSI Circuits

Mitigating Soft Errors and Process Variations

Authors: Garg, Rajesh

  • Describes the state-of-the-art in the areas of radiation tolerance circuit design and process variation tolerant circuit design
  • Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations as well as techniques to minimize the effects due to these to problems
  • Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be easily understood and applied by VLSI designers
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eBook $109.00
price for USA in USD (gross)
  • ISBN 978-1-4419-0931-2
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA in USD
  • ISBN 978-1-4419-0930-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.99
price for USA in USD
  • ISBN 978-1-4899-8510-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
About this book

This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors.

This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems.

  • Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design;
  • Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems;
  • Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.

Table of contents (11 chapters)

  • Introduction

    Garg, Rajesh (et al.)

    Pages 1-17

  • Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits

    Garg, Rajesh (et al.)

    Pages 21-40

  • Analytical Determination of the Radiation-induced Pulse Shape

    Garg, Rajesh (et al.)

    Pages 41-58

  • Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes

    Garg, Rajesh (et al.)

    Pages 59-70

  • 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits

    Garg, Rajesh (et al.)

    Pages 71-86

Buy this book

eBook $109.00
price for USA in USD (gross)
  • ISBN 978-1-4419-0931-2
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA in USD
  • ISBN 978-1-4419-0930-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.99
price for USA in USD
  • ISBN 978-1-4899-8510-1
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Analysis and Design of Resilient VLSI Circuits
Book Subtitle
Mitigating Soft Errors and Process Variations
Authors
Copyright
2010
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-1-4419-0931-2
DOI
10.1007/978-1-4419-0931-2
Hardcover ISBN
978-1-4419-0930-5
Softcover ISBN
978-1-4899-8510-1
Edition Number
1
Number of Pages
XXII, 212
Topics