Handbook of Microscopy for Nanotechnology

Editors: Yao, Nan, Wang, Zhong Lin (Eds.)

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About this book

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Reviews

From the reviews:

"Nanostructured materials have a rich variety of properties … . This complete reference provides a thorough treatment of these techniques and their applications." (Materials Today, 2005)


Table of contents (22 chapters)

Table of contents (22 chapters)
  • Confocal Scanning Optical Microscopy and Nanotechnology

    Pages 3-24

    Lu, Peter J.

  • Scanning Near-Field Optical Microscopy in Nanosciences

    Pages 25-54

    Bouhelier, Alexandre (et al.)

  • Scanning Tunneling Microscopy

    Pages 55-112

    Jia, Jin-Feng (et al.)

  • Visualization of Nanostructures with Atomic Force Microscopy

    Pages 113-155

    Magonov, Sergei N. (et al.)

  • Scanning Probe Microscopy for Nanoscale Manipulation and Patterning

    Pages 157-182

    Hong, Seunghun (et al.)

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  • ISBN 978-1-4020-8006-7
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  • Immediate eBook download after purchase and usable on all devices
Hardcover  
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Bibliographic Information

Bibliographic Information
Book Title
Handbook of Microscopy for Nanotechnology
Editors
  • Nan Yao
  • Zhong Lin Wang
Copyright
2005
Publisher
Springer US
Copyright Holder
Springer-Verlag US
Distribution Rights
No distribution rights for China
eBook ISBN
978-1-4020-8006-7
DOI
10.1007/1-4020-8006-9
Hardcover ISBN
978-1-4020-8003-6
Edition Number
1
Number of Pages
XX, 731
Topics