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Total Least Squares and Errors-in-Variables Modeling

Analysis, Algorithms and Applications

  • Book
  • © 2002

Overview

Editors:
  1. Sabine Huffel

    1. Department of Electrical Engineering, Katholieke Universiteit, Leuven-Heverlee, Belgium

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  2. Philippe Lemmerling

    1. Department of Electrical Engineering, Katholieke Universiteit, Leuven-Heverlee, Belgium

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    You can also search for this editor in PubMed   Google Scholar

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Table of contents (34 chapters)

  1. Front Matter

    Pages i-x
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  2. Introduction to Total Least Squares and Errors-In-Variables Modeling

    1. Introduction to Total Least Squares and Errors-In-Variables Modeling

      • Sabine Van Huffel, Philippe Lemmerling
      Pages 1-11

  3. Basic Concepts and Analysis in Errors-In-Variables Modeling

    1. Front Matter

      Pages 13-13
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    2. TLS and Its Improvements by Semiparametric Approach

      • Shun-ichi Amari, Motoaki Kawanabe
      Pages 15-24

    3. Unifying Least Squares, Total Least Squares and Data Least Squares

      • Christopher C. Paige, ZdenÄ›k StrakoÅ¡
      Pages 25-34

    4. Bounds for the Least Squares Residual Using Scaled Total Least Squares

      • Christopher C. Paige, ZdenÄ›k StrakoÅ¡
      Pages 35-44

  4. Total Least Squares Algorithms

    1. Front Matter

      Pages 45-45
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    2. Recent Developments in Rank Revealing and Lanczos Methods for TLS-Related Problems

      • Ricardo D. Fierro, Per Christian Hansen
      Pages 47-56

    3. A Regularized Total Least Squares Algorithm

      • Hongbin Guo, Rosemary A. Renaut
      Pages 57-66

    4. The Parametric Quadratic Form Method for Solving TLS Problems with Elementwise Weighting

      • Amedeo Premoli, Maria Luisa Rastello
      Pages 67-76

  5. Structured Total Least Squares Problems

    1. Front Matter

      Pages 77-77
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    2. Structured Total Least Squares

      • Philippe Lemmerling, Sabine Van Huffel
      Pages 79-91

    3. Fast Structured Total Least Squares Algorithms via Exploitation of the Displacement Structure

      • Nicola Mastronardi, Philippe Lemmerling, Sabine Van Huffel
      Pages 93-106

    4. The Extended STLS Algorithm for Minimizing the Extended LS Criterion

      • Arie Yeredor
      Pages 107-117

  6. Nonlinear Errors-In-Variables Models and Statistical Estimators

    1. Front Matter

      Pages 119-119
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    2. Bayesian Smoothing for Measurement Error Problems

      • Scott M. Berry, Raymond J. Carroll, David Ruppert
      Pages 121-130

    3. On the Polynomial Measurement Error Model

      • Chi-Lun Cheng, Hans Schneeweiss
      Pages 131-143

    4. On Consistent Estimators in Nonlinear Functional Errors-In-Variables Models

      • Alexander Kukush, Silvelyn Zwanzig
      Pages 145-154

    5. On Consistent Estimators in Linear and Bilinear Multivariate Errors-In-Variables Models

      • Alexander Kukush, Ivan Markovsky, Sabine Van Huffel
      Pages 155-164

    6. Identification of Semi-Linear Models within an Errors-In-Variables Framework

      • Rik Pintelon, Johan Schoukens
      Pages 165-177
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Keywords

About this book

In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems.

Editors and Affiliations

  • Department of Electrical Engineering, Katholieke Universiteit, Leuven-Heverlee, Belgium

    Sabine Huffel, Philippe Lemmerling

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