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  • Book
  • © 2009

Data Modeling for Metrology and Testing in Measurement Science

Birkhäuser
  • Takes the reader beyond mainstream methods described in standard texts on data and uncertainty analysis
  • Real-world applications in a variety of fields, including chemistry, software engineering, and metrology
  • For a broad audience of graduate students, researchers, and practitioners in metrology, mathematics, statistics, chemistry, and software engineering
  • May be used as a textbook in graduate courses on modeling and computational methods, or as a training manual in the fields of calibration and testing
  • Includes supplementary material: sn.pub/extras

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Table of contents (14 chapters)

  1. Front Matter

    Pages 1-17
  2. Probability in Metrology

    • Giovanni B. Rossi
    Pages 1-40
  3. Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty

    • William F. Guthrie, Hung-kung Liu, Andrew L. Rukhin, Blaza Toman, Jack C. M. Wang, Nien-fan Zhang
    Pages 1-45
  4. Frequency and Time—Frequency Domain Analysis Tools in Measurement

    • Pedro M. Ramos, Raul C. Martins, Sergio Rapuano, Pasquale Daponte
    Pages 1-27
  5. Data Fusion, Decision-Making, and Risk Analysis: Mathematical Tools and Techniques

    • Pedro S. Girão, Octavian Postolache, José M. D. Pereira
    Pages 1-50
  6. Approaches to Data Assessment and Uncertainty Estimation in Testing

    • Wolfram Bremser, Werner Hässelbarth
    Pages 1-30
  7. Monte Carlo Modeling of Randomness

    • Alan G. Steele, Robert J. Douglas
    Pages 1-41
  8. Virtual Istrumentation

    • Octavian Postolache, Pedro S. Girão, José M.D. Pereira
    Pages 1-39
  9. Internet-Enabled Metrology

    • Tanasko Tasić
    Pages 1-19
  10. Back Matter

    Pages 1-18

About this book

The aim of this book is to provide, ?rstly, an introduction to probability and statistics especially directed to the metrology and testing ?elds and secondly, a comprehensive, newer set of modelling methods for data and uncertainty analysis that are generally not considered yet within mainstream methods. The book brings, for the ?rst time, a coherent account of these newer me- ods and their computational implementation. They are potentially important because they address problems in application ?elds where the usual hypot- ses that are at the basis of most of the traditional statistical and probabilistic methods, for example, relating to normality of the probability distributions, are frequently not ful?lled to such an extent that an accurate treatment of the calibration or test data using standard approaches is not possible. Additi- ally, the methods can represent alternative ways of data analysis, allowing a deeper understanding of complex situations in measurement. The book lends itself as a possible textbook for undergraduate or postgraduate study in an area where existing texts focus mainly on the most common and well-known methods that do not encompass modern approaches to calibration and testing problems. The book is structured in such a way to guide readers with only a g- eral interest in measurement issues through a series of review papers, from an initial introduction to modelling principles in metrology and testing, to the basic principles of probability in metrology and statistical approaches to - certainty assessment.

Reviews

From the reviews:

“This is a surprisingly eclectic compilation that I found full of interesting concepts and new knowledge. … Academic researchers and National Measurement Institutes will certainly recommend the text to their libraries. Their research students will benefit … .”­­­ (D. Brynn Hibbert, Accreditation and Quality Assurance, Vol. 15, 2010)

Editors and Affiliations

  • Metrologica (INRIM), Divisione Termodinamica, Istituto Nazionale di Ricerca, Torino, Italy

    Franco Pavese

  • MSC , Module 13 , National Physics Laboratory , Teddington, Middlesex, United Kingdom

    Alistair B. Forbes

Bibliographic Information

Buy it now

Buying options

eBook USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access