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Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 211)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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National Semiconductor, USA
Christopher Michael
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Ohio State University, USA
Mohammed Ismail
Bibliographic Information
Book Title: Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
Authors: Christopher Michael, Mohammed Ismail
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4615-3150-0
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1993
Hardcover ISBN: 978-0-7923-9299-6Published: 31 January 1993
Softcover ISBN: 978-1-4613-6379-8Published: 27 September 2012
eBook ISBN: 978-1-4615-3150-0Published: 06 December 2012
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XVII, 190
Topics: Computer-Aided Engineering (CAD, CAE) and Design, Electrical Engineering