Frontiers in Electronic Testing

Analog and Mixed-Signal Boundary-Scan

A Guide to the IEEE 1149.4 Test Standard

Editors: Osseiran, Adam (Ed.)

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About this book

This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.

About the authors

Adam Osseiran is Professor of Electrical Engineering at the Engineering Institute of Geneva, Switzerland and the European Design and Test Specialist at Fluence Technology Inc., Beaverton, Oregon, USA. He is the present Chair of the IEEE 1149.4 Working Group.

Table of contents (6 chapters)

Table of contents (6 chapters)

Buy this book

eBook $169.00
price for USA in USD
  • ISBN 978-1-4757-4499-6
  • Digitally watermarked, DRM-free
  • Included format: PDF, EPUB
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $219.99
price for USA in USD
  • ISBN 978-0-7923-8686-5
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
Softcover $219.99
price for USA in USD
  • ISBN 978-1-4419-5115-1
  • Free shipping for individuals worldwide
  • Institutional customers should get in touch with their account manager
  • Covid-19 shipping restrictions
  • Usually ready to be dispatched within 3 to 5 business days, if in stock
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Bibliographic Information

Bibliographic Information
Book Title
Analog and Mixed-Signal Boundary-Scan
Book Subtitle
A Guide to the IEEE 1149.4 Test Standard
Editors
  • Adam Osseiran
Series Title
Frontiers in Electronic Testing
Series Volume
16
Copyright
1999
Publisher
Springer US
Copyright Holder
Springer Science+Business Media Dordrecht
eBook ISBN
978-1-4757-4499-6
DOI
10.1007/978-1-4757-4499-6
Hardcover ISBN
978-0-7923-8686-5
Softcover ISBN
978-1-4419-5115-1
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XVIII, 156
Topics