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Frontiers in Electronic Testing

Design for AT-Speed Test, Diagnosis and Measurement

Editors: Nadeau-Dostie, Benoit (Ed.)

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  • ISBN 978-0-306-47544-3
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About this book

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

Table of contents (8 chapters)

Table of contents (8 chapters)

Buy this book

eBook $109.00
price for USA in USD
  • ISBN 978-0-306-47544-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $219.99
price for USA in USD
Softcover $149.99
price for USA in USD
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Bibliographic Information

Bibliographic Information
Book Title
Design for AT-Speed Test, Diagnosis and Measurement
Editors
  • Benoit Nadeau-Dostie
Series Title
Frontiers in Electronic Testing
Series Volume
15
Copyright
2000
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-0-306-47544-3
DOI
10.1007/b117472
Hardcover ISBN
978-0-7923-8669-8
Softcover ISBN
978-1-4757-8291-2
Series ISSN
0929-1296
Edition Number
1
Number of Pages
XVII, 239
Topics

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