Frontiers in Electronic Testing

On-Line Testing for VLSI

Editors: Nicolaidis, Michael, Zorian, Yervant, Pradhan, Dhiraj (Eds.)

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About this book

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Table of contents (15 chapters)

Table of contents (15 chapters)

Buy this book

eBook $109.00
price for USA in USD (gross)
  • ISBN 978-1-4757-6069-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $169.99
price for USA in USD
  • ISBN 978-0-7923-8132-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.99
price for USA in USD
  • ISBN 978-1-4419-5033-8
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
On-Line Testing for VLSI
Editors
  • Michael Nicolaidis
  • Yervant Zorian
  • Dhiraj Pradhan
Series Title
Frontiers in Electronic Testing
Series Volume
11
Copyright
1998
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4757-6069-9
DOI
10.1007/978-1-4757-6069-9
Hardcover ISBN
978-0-7923-8132-7
Softcover ISBN
978-1-4419-5033-8
Series ISSN
0929-1296
Edition Number
1
Number of Pages
IV, 160
Topics