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Table of contents (19 chapters)
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Introduction to Testing
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Design for Testability
Keywords
About this book
Authors and Affiliations
Bibliographic Information
Book Title: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Authors: Michael L. Bushnell, Vishwani D. Agrawal
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/b117406
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2002
Hardcover ISBN: 978-0-7923-7991-1Published: 30 November 2000
Softcover ISBN: 978-1-4757-8142-7Published: 07 April 2013
eBook ISBN: 978-0-306-47040-0Published: 11 April 2006
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XVIII, 690
Topics: Electronics and Microelectronics, Instrumentation, Theory of Computation, Circuits and Systems, Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design