Authors:
- Presents basic modeling and simulation tools for quantitative description of thin film morphological evolution
- Displays clear conceptual developments in the fundamental understanding of complex surface growth phenomena
- Provides a close connection between modeling and simulations and various practical deposition methodologies
- Requires minimum mathematical and computer programming backgrounds to learn the subject
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 108)
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Table of contents (10 chapters)
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Front Matter
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Description of Thin Film Morphology
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Continuum Surface Growth Models
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Discrete Surface Growth Models
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Back Matter
About this book
Authors and Affiliations
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Department of Physics, Applied Physics and Astronomy, and Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, USA
Matthew Pelliccione, Toh-Ming Lu
Bibliographic Information
Book Title: Evolution of Thin Film Morphology
Book Subtitle: Modeling and Simulations
Authors: Matthew Pelliccione, Toh-Ming Lu
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-0-387-75109-2
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag New York 2008
Hardcover ISBN: 978-0-387-75108-5
Softcover ISBN: 978-1-4419-2580-0
eBook ISBN: 978-0-387-75109-2
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XII, 206
Topics: Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Tribology, Corrosion and Coatings