Lecture Notes in Electrical Engineering
cover

Digital Noise Monitoring of Defect Origin

Authors: Aliev, Telman

  • Includes several technologies that cover the initial stage of the origin of the defect
  • Theoretically proves the various technologies
  • Exemplifies the applications for solving problems concerning noise monitoring at the beginning of the defect origin
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eBook $139.00
price for USA in USD
  • ISBN 978-0-387-71754-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
Softcover $179.99
price for USA in USD
About this book

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Reviews

From the reviews:

“The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry.” (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)

Table of contents (7 chapters)

Table of contents (7 chapters)
  • Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features

    Pages 1-22

  • Position-Binary Technology of Monitoring Defect at its Origin

    Pages 23-41

  • Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin

    Pages 43-81

  • Robust Correlation Monitoring of a Defect at its Origin

    Pages 83-111

  • Spectral Monitoring of a Defect's Origin

    Pages 113-133

Buy this book

eBook $139.00
price for USA in USD
  • ISBN 978-0-387-71754-8
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $179.99
price for USA in USD
Softcover $179.99
price for USA in USD
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Bibliographic Information

Bibliographic Information
Book Title
Digital Noise Monitoring of Defect Origin
Authors
Series Title
Lecture Notes in Electrical Engineering
Series Volume
2
Copyright
2007
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-0-387-71754-8
DOI
10.1007/978-0-387-71754-8
Hardcover ISBN
978-0-387-71753-1
Softcover ISBN
978-1-4419-4410-8
Series ISSN
1876-1100
Edition Number
1
Number of Pages
XII, 224
Topics