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NanoScience and Technology

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

Authors: Foster, Adam, Hofer, Werner A.

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  • ISBN 978-0-387-37231-0
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About this book

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Table of contents (10 chapters)

Table of contents (10 chapters)
  • The Physics of Scanning Probe Microscopes

    Pages 1-10

  • SPM: The Instrument

    Pages 11-36

  • Theory of Forces

    Pages 37-54

  • Electron Transport Theory

    Pages 55-102

  • Transport in the Low Conductance Regime

    Pages 103-131

Buy this book

eBook $119.00
price for USA in USD
  • ISBN 978-0-387-37231-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $219.99
price for USA in USD
  • ISBN 978-0-387-40090-7
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
Softcover $159.99
price for USA in USD
  • ISBN 978-1-4419-2306-6
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Probe Microscopy
Book Subtitle
Atomic Scale Engineering by Forces and Currents
Authors
Series Title
NanoScience and Technology
Copyright
2006
Publisher
Springer-Verlag New York
Copyright Holder
Springer-Verlag New York
eBook ISBN
978-0-387-37231-0
DOI
10.1007/0-387-37231-8
Hardcover ISBN
978-0-387-40090-7
Softcover ISBN
978-1-4419-2306-6
Series ISSN
1434-4904
Edition Number
1
Number of Pages
XIV, 282
Topics

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