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Scanning Microscopy for Nanotechnology

Techniques and Applications

Editors: Zhou, Weilie, Wang, Zhong Lin (Eds.)

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eBook $139.00
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  • ISBN 978-0-387-39620-0
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Hardcover $219.99
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Softcover $179.99
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About this book

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

Table of contents (15 chapters)

Table of contents (15 chapters)
  • Fundamentals of Scanning Electron Microscopy (SEM)

    Pages 1-40

    Zhou, Weilie (et al.)

  • Backscattering Detector and EBSD in Nanomaterials Characterization

    Pages 41-75

    Maitland, Tim (et al.)

  • X-ray Microanalysis in Nanomaterials

    Pages 76-100

    Anderhalt, Robert

  • Low kV Scanning Electron Microscopy

    Pages 101-119

    Frey, M. David

  • E-beam Nanolithography Integrated with Scanning Electron Microscope

    Pages 120-151

    Nabity, Joe (et al.)

Buy this book

eBook $139.00
price for USA in USD
  • ISBN 978-0-387-39620-0
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $219.99
price for USA in USD
Softcover $179.99
price for USA in USD
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Bibliographic Information

Bibliographic Information
Book Title
Scanning Microscopy for Nanotechnology
Book Subtitle
Techniques and Applications
Editors
  • Weilie Zhou
  • Zhong Lin Wang
Copyright
2007
Publisher
Springer-Verlag New York
Copyright Holder
Springer-Verlag New York
eBook ISBN
978-0-387-39620-0
DOI
10.1007/978-0-387-39620-0
Hardcover ISBN
978-0-387-33325-0
Softcover ISBN
978-1-4419-2209-0
Edition Number
1
Number of Pages
XIV, 522
Number of Illustrations
399 b/w illustrations
Topics

*immediately available upon purchase as print book shipments may be delayed due to the COVID-19 crisis. ebook access is temporary and does not include ownership of the ebook. Only valid for books with an ebook version. Springer Reference Works and instructor copies are not included.