Editors:
Appeals to researchers from disciplines as diverse as physics, chemistry, biology, molecular engineering and biotechnology
Presents practical aspects of materials characterization as applied to semiconductors, ferroelectrics, dielectrics, polymers, and biomolecules
Describes electrical SPM-based approaches to nanofabrication and nanolithography
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Table of contents (36 chapters)
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Front Matter
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Introduction
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SPM Techniques for Electrical Characterization
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Front Matter
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Electrical and Electromechanical Imaging at the Limits of Resolution
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Front Matter
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About this book
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Reviews
From the reviews:
"The stated goal of this book is ‘to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.’ … The images are particularly clear even to the non-specialist eyes. … The black and white and color figures are of good quality. The photographs are all excellent. … will be helpful to materials scientists in universities and research centers." (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)
Editors and Affiliations
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Oak Ridge National Laboratory, Oak Ridge, USA
Sergei Kalinin
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Dept. Materials Science and Engineering, North Carolina State University, Raleigh, USA
Alexei Gruverman
Bibliographic Information
Book Title: Scanning Probe Microscopy
Book Subtitle: Electrical and Electromechanical Phenomena at the Nanoscale
Editors: Sergei Kalinin, Alexei Gruverman
DOI: https://doi.org/10.1007/978-0-387-28668-6
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag New York 2007
Hardcover ISBN: 978-0-387-28667-9Published: 18 December 2006
Softcover ISBN: 978-1-4939-5036-2Published: 04 November 2016
eBook ISBN: 978-0-387-28668-6Published: 03 April 2007
Edition Number: 1
Number of Pages: XXXVIII, 980
Number of Illustrations: 13 b/w illustrations, 16 illustrations in colour
Topics: Characterization and Evaluation of Materials, Nanotechnology, Surfaces and Interfaces, Thin Films, Biological Microscopy, Mechanical Engineering, Solid State Physics