Scanning Electron Microscopy and X-ray Microanalysis

Third Edition

Authors: Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R.

Buy this book

eBook 67,82 €
price for Spain (gross)
  • ISBN 978-1-4615-0215-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 97,18 €
price for Spain (gross)
  • ISBN 978-0-306-47292-3
  • with online files
  • Free shipping for individuals worldwide
  • This title is currently reprinting. You can pre-order your copy now.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 83,19 €
price for Spain (gross)
  • ISBN 978-1-4613-4969-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
About this Textbook

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.

Reviews

“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be without.” (Thomas J. Wilson, Scanning, Vol. 27 (4), July/August, 2005)

“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. 9 (5), October, 2003)


Table of contents (15 chapters)

  • Introduction

    Goldstein, Joseph I. (et al.)

    Pages 1-20

    Preview Buy Chapter 30,19 €
  • The SEM and Its Modes of Operation

    Goldstein, Joseph I. (et al.)

    Pages 21-60

    Preview Buy Chapter 30,19 €
  • Electron Beam–Specimen Interactions

    Goldstein, Joseph I. (et al.)

    Pages 61-98

    Preview Buy Chapter 30,19 €
  • Image Formation and Interpretation

    Goldstein, Joseph I. (et al.)

    Pages 99-193

    Preview Buy Chapter 30,19 €
  • Special Topics in Scanning Electron Microscopy

    Goldstein, Joseph I. (et al.)

    Pages 195-270

    Preview Buy Chapter 30,19 €

Buy this book

eBook 67,82 €
price for Spain (gross)
  • ISBN 978-1-4615-0215-9
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 97,18 €
price for Spain (gross)
  • ISBN 978-0-306-47292-3
  • with online files
  • Free shipping for individuals worldwide
  • This title is currently reprinting. You can pre-order your copy now.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Softcover 83,19 €
price for Spain (gross)
  • ISBN 978-1-4613-4969-3
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Scanning Electron Microscopy and X-ray Microanalysis
Book Subtitle
Third Edition
Authors
Copyright
2003
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4615-0215-9
DOI
10.1007/978-1-4615-0215-9
Hardcover ISBN
978-0-306-47292-3
Softcover ISBN
978-1-4613-4969-3
Edition Number
3
Number of Pages
XIX, 689
Topics