Overview
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Table of contents(28 chapters)
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Keynote Address
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Semiconductor Characterization and Adsorbate Characterization
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Biological and Chemical Nanostructure
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New Developments in AFM/STM
About this book
Editors and Affiliations
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Natick Research, Development and Engineering Center, U.S. Army Soldier Systems Command, Natick, USA
Samuel H. Cohen, Marcia L. Lightbody
Bibliographic Information
Book Title: Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Editors: Samuel H. Cohen, Marcia L. Lightbody
DOI: https://doi.org/10.1007/978-1-4757-9325-3
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1997
Hardcover ISBN: 978-0-306-45596-4Published: 30 April 1997
Softcover ISBN: 978-1-4757-9327-7Published: 04 June 2013
eBook ISBN: 978-1-4757-9325-3Published: 29 June 2013
Edition Number: 1
Number of Pages: X, 250
Topics: Characterization and Evaluation of Materials, Biological Microscopy, Analytical Chemistry, Atomic/Molecular Structure and Spectra