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Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Editors: Cohen, Samuel H., Lightbody, Marcia L. (Eds.)

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About this book

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Table of contents (28 chapters)

  • Keynote Address

    Crommie, Michael F.

    Pages 1-3

  • Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection

    Hong, Shane Y.

    Pages 7-22

  • Scanning Tunneling Microscopy-Based Fabrication of Nanometer Scale Structures

    Nayfeh, Munir H.

    Pages 23-40

  • A Microscopy for Our Time

    Solit, Elinor

    Pages 41-44

  • Scanning Tunneling Microscopy of Chemical Vapor Deposition Diamond Film Growth on Highly Oriented Pyrolytic Graphite and Silicon

    Aviles, A. F. (et al.)

    Pages 45-51

Buy this book

eBook $139.00
price for USA in USD (gross)
  • ISBN 978-1-4757-9325-3
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA in USD
  • ISBN 978-0-306-45596-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $179.99
price for USA in USD
  • ISBN 978-1-4757-9327-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Editors
  • Samuel H. Cohen
  • Marcia L. Lightbody
Copyright
1997
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4757-9325-3
DOI
10.1007/978-1-4757-9325-3
Hardcover ISBN
978-0-306-45596-4
Softcover ISBN
978-1-4757-9327-7
Edition Number
1
Number of Pages
X, 250
Topics