Nondestructive Characterization of Materials IV
Editors: Bussière, J.F., Green, Robert E., Ruud, C.O. (Eds.)
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- About this book
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There is a great deal of interest in extending nondestructive technologies beyond the location and identification of cracks and voids. Specifically there is growing interest in the application of nondestructive evaluation (NOEl to the measurement of physical and mechanical properties of materials. The measurement of materials properties is often referred to as materials characterization; thus nondestructive techniques applied to characterization become nondestructive characterization (NDCl. There are a number of meetings, proceedings and journals focused upon nondestructive technologies and the detection and identification of cracks and voids. However, the series of symposia, of which these proceedings represent the fourth, are the only meetings uniquely focused upon nondestructive characterization. Moreover, these symposia are especially concerned with stimulating communication between the materials, mechanical and manufacturing engineer and the NDE technology oriented engineer and scientist. These symposia recognize that it is the welding of these areas of expertise that is necessary for practical development and application of NDC technology to measurements of components for in service life time and sensor technology for intelligent processing of materials. These proceedings are from the fourth international symposia and are edited by c.o. Ruud, J. F. Bussiere and R.E. Green, Jr. . The dates, places, etc of the symposia held to date area as follows: Symposia on Nondestructive Methods for TITLE: Material Property Determination DATES: April 6-8, 1983 PLACE: Hershey, PA, USA CHAIRPERSONS: C.O. Ruud and R.E. Green, Jr.
- Table of contents (49 chapters)
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Accurate Structural Characterization of ZrN Coatings and Epitaxial Layers by X-Ray Diffraction Using the DOSOPHATEX System
Pages 1-8
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Nondestructive Characterization of the Structure and Mechanical Properties of Metallic Superlattice Thin Films
Pages 9-14
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X-Ray Stress Studies of Aluminum Metallizations on Silicon Substrate
Pages 15-24
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Micromechanical Analysis of the TiO2/Si Interface Using the Scanning Acoustic Microscope
Pages 25-31
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Real Time Spectroscopic Ellipsometry for Non-Invasive Characterization of Thin Film Growth and Etching
Pages 33-40
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Table of contents (49 chapters)
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Bibliographic Information
- Bibliographic Information
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- Book Title
- Nondestructive Characterization of Materials IV
- Editors
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- J.F. Bussière
- Robert E. Green
- C.O. Ruud
- Copyright
- 1991
- Publisher
- Springer US
- Copyright Holder
- Springer Science+Business Media New York
- eBook ISBN
- 978-1-4899-0670-0
- DOI
- 10.1007/978-1-4899-0670-0
- Hardcover ISBN
- 978-0-306-44047-2
- Softcover ISBN
- 978-1-4899-0672-4
- Edition Number
- 1
- Number of Pages
- XII, 516
- Topics
