Defect and Fault Tolerance in VLSI Systems

Volume 2

Editors: Stapper, C.H., Jain, V.K., Saucier, Gabriele (Eds.)

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About this book

Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he conĀ­ tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.

Table of contents (25 chapters)

  • Fault-Free or Fault-Tolerant VLSI Manufacture

    Stapper, C. H.

    Pages 1-13

  • Yield Models - Comparative Study

    Maly, W.

    Pages 15-31

  • A Unified Approach to Yield Analysis of Defect Tolerant Circuits

    Koren, Z. (et al.)

    Pages 33-45

  • Systematic Extraction of Critical Areas From IC Layouts

    Pineda de Gyvez, J. (et al.)

    Pages 47-61

  • The Effect on Yield of Clustering and Radial Variations in Defect Density

    Ferris-Prabhu, A. V. (et al.)

    Pages 63-73

Buy this book

eBook $119.00
price for USA in USD (gross)
  • ISBN 978-1-4757-9957-6
  • Digitally watermarked, DRM-free
  • Included format: PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover $199.99
price for USA in USD
  • ISBN 978-0-306-43531-7
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $159.99
price for USA in USD
  • ISBN 978-1-4757-9959-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Defect and Fault Tolerance in VLSI Systems
Book Subtitle
Volume 2
Editors
  • C.H. Stapper
  • V.K. Jain
  • Gabriele Saucier
Copyright
1990
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
eBook ISBN
978-1-4757-9957-6
DOI
10.1007/978-1-4757-9957-6
Hardcover ISBN
978-0-306-43531-7
Softcover ISBN
978-1-4757-9959-0
Edition Number
1
Number of Pages
XIII, 316
Topics