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Journal of Metrology Society of India

Editor-in-Chief: Sanjay Yadav

ISSN: 0970-3950 (print version)
ISSN: 0974-9853 (electronic version)

Journal no. 12647

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Dr. Sanjay Yadav, CSIR-National Physical Laboratory, New Delhi, India 

Dr. S. K. Jaiswal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Naveen Garg, CSIR-National Physical Laboratory, New Delhi, India 


Dr. Ravinder Agarwal, Thapar University, Patiala, Punjab, India
Dr. Ashish Agarwal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Shankar G. Aggarwal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Kamlesh Patel, University of Delhi, New Delhi, India
Dr. K.S. Nagla, National Institute of Technology (NIT), Jalandhar, India
Dr. Devraj Singh, Amity School of Engineering and Technology, Delhi, India

Dr. D. K. Aswal, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Martin Milton, BIPM, France
Dr. Thomas Liew, Agency for Science, Technology and Research (A*STAR), Singapore
Dr. Wolfram Bremser, BAM Federal Institute for Materials Research & Testing (BAM), Berlin, Germany
Dr. Joachim Fischer, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany 
Dr. Sam-Yong Woo, Korea Research Institute of Standards and Science (KRISS), Daejeon, Republic of Korea 
Dr. T.J.B.M. Janssen, National Physical Laboratory, Middlesex, UK 
Dr. Takashi Usuda, National Metrology Institute of Japan (NMIJ), lbaraki, Japan 
Dr. Toshiyuki Takatsuji, National Metrology Institute of Japan (NMIJ), lbaraki, Japan 
Mr.  A. K. Saxena, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Costas Varotsos, National and Kapodistrian University of Athens, Athens, Greece 
Dr. Peter Fisk, National Measurement Institute (NMI), West Lindfield NSW, Australia 
Dr. Ma Liandi, National Institute of Metrology (NIM), Beijing, China 
Mr. Ian Veldman, National Metrology Institute of South Africa (NMISA), Pretoria, South Africa 
Dr. K.P Chaudhary, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Douglas Olson, National Institute of Standards and Technology (NIST), Gaithersburg, USA
Dr. Ranjana Mehrotra, CSIR–National Physical Laboratory, New Delhi, India 
Mr. Anil Kumar, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Vinay Shankar Pandey, National Institute of Technology (NIT), Delhi
Dr. J. C. Torres-Guzmán, Centro Nacional de Metrología (CENAM), Mexico
Dr. A. Sengupta, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Seng-Jue Chen, CMS/ITRC, Taiwan
Dr. Rajveer Singh, Ambedkar Institute of Advanced Communication Technologies and Research, (AIACTR), New Delhi, India
Dr. B. P. Patel, Indian Institute of Technology Delhi, India
Dr. J.H. Shaw, CMS/ITRI, Taiwan
Dr. Tokihiko Kobata, National Metrology Institute of Japan (NMIJ), lbaraki, Japan 
Dr.  R. K. Kotnala, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India 
Mr. Anil Agarwal, Measurement Science and Standards, National Research Council, Canada
Dr. Stuart Davidson, National Physical Laboratory (NPL), UK 
Dr. Victoria Anne Coleman, National Measurement Institute (NMI), West Lindfield NSW, Australia 

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    MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology.

    The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.

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