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Editors

Editors-in-Chief
O. K. Matar, Imperial College London, UK
S. Kumar, University of Minnesota, USA

Editorial Board
V. Ajaev, Southern Methodist University, USA
P. Anderson, Eindhoven University of Technology, The Netherlands
A. P. Bassom, University of Tasmania, Australia
J. Billingham, University of Nottingham, UK
M. Blyth, University of East Anglia, UK
J. Bostwick, Clemson Universty, USA
R. J. Braun, University of Delaware, USA
P. Ciarletta, Politecnico di Milano, Italy
R. Clarke, University of Auckland, New Zealand
G. Elfring, University of British Columbia, Canada
L. K. Forbes, University of Tasmania, Australia
E. Fried, Okinawa Institute of Science and Technology Graduate University, Japan
M. Heil, University of Manchester, UK
R. E. Hewitt, University of Manchester, UK
A. Khair, Carnegie Mellon University, USA
L. Kondic, New Jersey Institute of Technology, USA
A. A. Korobkin, University of East Anglia, UK
P. R. Kramer, Rensselaer Polytechnic Institute, USA
L. P. Liu, Rutgers University, USA
H. Masoud, Michigan Technological University, USA
S. W. McCue, Queensland University of Technology, Australia
G. McKinley, MIT, USA
P. A. Milewski, University of Bath, UK
R. Narayanan, University of Florida, USA
O. Lopez-Pamies, University of Illinois Urbana-Champaign, USA
Q.H. Qin, Shenzhen MSU-BIT University, China
S. W. Rienstra, Eindhoven University of Technology, The Netherlands
K. C. Sahu, Indian Institute of Technology Hyderabad, India
O. Schnitzer, Imperial College London, UK
G. P. Raja Sekhar, Indian Institute of Technology Kharagpur, India
M. S. Siegel, New Jersey Institute of Technology, USA
F. T. Smith, University College London, UK
K. Soldatos, University of Nottingham, UK
J. Stockie, Simon Fraser University, Canada
Y. Stokes, University of Adelaide, Australia
A. E. P. Veldman, University of Groningen, The Netherlands
D. Vella, University of Oxford, UK
J. Wang, Peking University, China
J. S. Wang, Tianjin University, China
B. R. Wetton, University of British Columbia, Canada
S. Wilson, University of Strathclyde, UK
T. P. Witelski, Duke University, USA
J. Ye, Lancaster University, UK
Y.-N. Young, New Jersey Institute of Technology, USA

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