Overview
- Gives a state-of-the-art report of the understanding of X-ray scattering and diffraction
- Contains theoretical methods for a wide range of X-ray materials research
- Includes detailed explanations of theoretical models and approaches
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 183)
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Table of contents (7 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Authors and Affiliations
About the authors
Andrey Benediktovich is working at the department of Theoretical Physics, Belarusian State University, Minsk, Belarus. Since several years he takes a part in joint projects with Bruker AXS, which are dedicated to the development of modern analytical methods for X-ray data analysis. He also collaborates with Siegen University (Germany) for theoretical simulation of the X-ray diffraction processes occured at X-ray Free Electron Lasers.
Ilya Feranchuk is a Chair and Professor of the Theoretical Physics Department at Belarusian State University. He recieved his PhD (1975) and DSc (1985) in theoretical physics at the same university. In the early seventies he was a first discover of the parametric X-ray radiation, and next decades was involved in studies on this effect. In 2002 he was awarded by a State Prize of Belarus for investigation of PXR. Last decade he is focused on analytical X-ray scattering methods (HRXRD, XRR, GISAXS, etc) used in modern nanoscience and semiconductor industries as well as conducts the fundamental researches of interaction of X-rays with crystalline, polycrystalline and amorphous materials.
Alex Ulyanenkov received his PhD (1991, title “Operator method for description of quantum systems in periodic fields”) and D.Sc. (2007, title: "Non-perturbative methods for microscopic description of coherent processes during the interaction of charged particles and x-rays with crystals and nanostructures") in Physics from Belarusian State University. His present scientific activity includes the studies of X-ray scattering from nanostructures, thin solid films, semiconductor multilayers and superlattices, porous matter, largemolecules and proteins. He is Managing Director of Rigaku Europe SE, the part of Rigaku Corporation, one of the world leaders in the production of X-ray analytical instruments. Within the recent decades, he was working at Potsdam University, later at Science University of Tokyo, Japan, and for Bruker AXS GmbH.
Bibliographic Information
Book Title: Theoretical Concepts of X-Ray Nanoscale Analysis
Book Subtitle: Theory and Applications
Authors: Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-642-38177-5
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2014
Hardcover ISBN: 978-3-642-38176-8Published: 18 September 2013
Softcover ISBN: 978-3-662-52054-3Published: 27 August 2016
eBook ISBN: 978-3-642-38177-5Published: 07 September 2013
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XIII, 318
Number of Illustrations: 71 b/w illustrations, 37 illustrations in colour
Topics: Measurement Science and Instrumentation, Characterization and Evaluation of Materials, Theoretical, Mathematical and Computational Physics, Applied and Technical Physics, Spectroscopy and Microscopy