Overview
- Designed to meet the needs of materials scientists, including students, teachers and researchers
- Can be used as both an introductory and advanced level graduate text
- Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
- Problems for the student are appended to each chapter
- Includes supplementary material: sn.pub/extras
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Table of contents (11 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Reviews
"I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."
(John Hutchison in Journal of Microscopy)
"I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization."
(Ray Egerton in Micron)
"A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience."
(John C. H. Spence, Arizona State University)
"I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course. It is a superb book."
(Colin Humphries, Cambridge University)
"This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended."
(Ronald Gronsky, University of California, Berkeley)
From the reviews of the second edition:
"Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 … but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions ‘ranging from substantial re-structuring to subtle rewording’. … I must insist that this text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized. It should be on a shelf in all electron microscopy laboratories … ." (Ultramicroscopy, Vol. 99, 2004)
"Thebook by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. … Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive … . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M. Brown, Contemporary Physics, Vol. 44 (6), 2003)
"The main objective of the present book is teaching. … Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended … ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003)
Authors and Affiliations
Bibliographic Information
Book Title: Transmission Electron Microscopy and Diffractometry of Materials
Authors: Brent Fultz, James M. Howe
DOI: https://doi.org/10.1007/978-3-662-04901-3
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2002
eBook ISBN: 978-3-662-04901-3Published: 29 June 2013
Edition Number: 2
Number of Pages: XXI, 748
Topics: Surfaces and Interfaces, Thin Films, Solid State Physics, Spectroscopy and Microscopy, Crystallography and Scattering Methods, Characterization and Evaluation of Materials