Authors:
- Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy
- Contains expanded reference lists as a launch point into the specialist literature
- Requires only a first-year undergraduate knowledge of physics
- Written by a leading author who received the 2004 Distinguished Physical Scientist Award of the Microscopical Society of America
- Covers principles and techniques essential to materials science, the semiconductor industry, nanotechnology, and the biomedical and forensic sciences
- Includes supplementary material: sn.pub/extras
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Table of contents (7 chapters)
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Front Matter
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Back Matter
About this book
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Authors and Affiliations
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Department of Physics, University of Alberta, Edmonton, Canada
R.F. Egerton
About the author
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.
Bibliographic Information
Book Title: Physical Principles of Electron Microscopy
Book Subtitle: An Introduction to TEM, SEM, and AEM
Authors: R.F. Egerton
DOI: https://doi.org/10.1007/978-3-319-39877-8
Publisher: Springer Cham
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer International Publishing Switzerland 2016
Hardcover ISBN: 978-3-319-39876-1Published: 07 July 2016
Softcover ISBN: 978-3-319-81986-0Published: 30 May 2018
eBook ISBN: 978-3-319-39877-8Published: 01 July 2016
Edition Number: 2
Number of Pages: XI, 196
Number of Illustrations: 109 b/w illustrations, 15 illustrations in colour
Topics: Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Biological Microscopy, Nanotechnology