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Advanced Transmission Electron Microscopy

Imaging and Diffraction in Nanoscience

  • Textbook
  • © 2017

Overview

Authors:
  1. Jian Min Zuo

    1. Frederick-Seitz Materials Research Laboratory, Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, USA

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  2. John C.H. Spence

    1. Department of Physics, Arizona State University, Tempe, USA

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  • Serves as an expanded and thoroughly updated successor to the authors’ 1992 “Electron Microdiffraction,” the leading text in the field
  • Improves on previous coverage of electron wave properties and electron diffraction theory in addition to many new chapters in such areas as strain-field analysis and electron detectors
  • Offers comprehensive, quantitative treatments of crystal symmetry, crystal structure and bonding, diffuse scattering, strain measurements, defects and nanostructure characterization
  • Provides new coverage of electron optics, principles of aberration correction and energy filters, electron nanodiffraction techniques, and TEM and STEM imaging theory
  • Presents the latest information on nanostructure analysis, emphasizing quantitative analysis of images and diffraction patterns
  • Includes numerous tables and figures for electron crystallography, and source listings of simulation and modeling computer programs
  • Includes supplementary material: sn.pub/extras

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Table of contents (17 chapters)

  1. Front Matter

    Pages i-xxvi
    Download chapter PDF

  2. Introduction and Historical Background

    • Jian Min Zuo, John C. H. Spence
    Pages 1-18

  3. Electron Waves and Wave Propagation

    • Jian Min Zuo, John C. H. Spence
    Pages 19-47

  4. The Geometry of Electron Diffraction Patterns

    • Jian Min Zuo, John C. H. Spence
    Pages 49-75

  5. Kinematical Theory of Electron Diffraction

    • Jian Min Zuo, John C. H. Spence
    Pages 77-100

  6. Dynamical Theory of Electron Diffraction for Perfect Crystals

    • Jian Min Zuo, John C. H. Spence
    Pages 101-141

  7. Electron Optics

    • Jian Min Zuo, John C. H. Spence
    Pages 143-164

  8. Lens Aberrations and Aberration Correction

    • Jian Min Zuo, John C. H. Spence
    Pages 165-191

  9. Electron Sources

    • Jian Min Zuo, John C. H. Spence
    Pages 193-206

  10. Electron Detectors

    • Jian Min Zuo, John C. H. Spence
    Pages 207-229

  11. Instrumentation and Experimental Techniques

    • Jian Min Zuo, John C. H. Spence
    Pages 231-295

  12. Crystal Symmetry

    • Jian Min Zuo, John C. H. Spence
    Pages 297-346

  13. Crystal Structure and Bonding

    • Jian Min Zuo, John C. H. Spence
    Pages 347-401

  14. Diffuse Scattering

    • Jian Min Zuo, John C. H. Spence
    Pages 403-440

  15. Atomic Resolution Electron Imaging

    • Jian Min Zuo, John C. H. Spence
    Pages 441-499

  16. Imaging and Characterization of Crystal Defects

    • Jian Min Zuo, John C. H. Spence
    Pages 501-552

  17. Strain Measurements and Mapping

    • Jian Min Zuo, John C. H. Spence
    Pages 553-580

  18. Structure of Nanocrystals, Nanoparticles, and Nanotubes

    • Jian Min Zuo, John C. H. Spence
    Pages 581-652

  19. Back Matter

    Pages 653-729
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Keywords

About this book

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.

Reviews

“This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy … . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work.” (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)

Authors and Affiliations

  • Frederick-Seitz Materials Research Laboratory, Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, USA

    Jian Min Zuo

  • Department of Physics, Arizona State University, Tempe, USA

    John C.H. Spence

About the authors

Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society.


John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).

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