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VLSI Design and Test for Systems Dependability

Editors: Asai, Shojiro (Ed.)

  • Is the first book to focus on the new roles VLSI is taking for the safe, secure, and dependable design and operation of electronic systems
  • Contributes to a better understanding of threats against safe and secure systems and how to mitigate them by advanced design and testing of VLSI as core components
  • Describes specific applications of design and testing for dependability in real-world applications such as controls for robots and vehicles, wireless communications, system of systems, and the Internet of Things (IoT)
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書籍の購入

イーブック ¥24,709
価格の適用国: Japan (日本円価格は個人のお客様のみ有効) (小計)
  • ISBN 978-4-431-56594-9
  • ウォーターマーク付、 DRMフリー
  • ファイル形式: PDF, EPUB
  • どの電子書籍リーダーからでもすぐにお読みいただけます。
  • ご購入後、すぐにダウンロードしていただけます。
ハードカバー ¥30,887
価格の適用国: Japan (日本円価格は個人のお客様のみ有効) (小計)
  • ISBN 978-4-431-56592-5
  • 個人のお客様には、世界中どこでも配送料無料でお届けします。
  • Usually dispatched within 3 to 5 business days.
この書籍について

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications.

This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Table of contents (29 chapters)

  • Challenges and Opportunities in VLSI for Systems Dependability

    Asai, Shojiro

    Pages 3-25

  • Design and Development of Electronic Systems for Quality and Dependability

    Asai, Shojiro

    Pages 27-54

  • Radiation-Induced Soft Errors

    Ibe, Eishi H. (et al.)

    Pages 57-127

    Preview Buy Chapter ¥3,412
  • Electromagnetic Noises

    Nagata, Makoto (et al.)

    Pages 129-161

  • Variations in Device Characteristics

    Onodera, Hidetoshi (et al.)

    Pages 163-201

書籍の購入

イーブック ¥24,709
価格の適用国: Japan (日本円価格は個人のお客様のみ有効) (小計)
  • ISBN 978-4-431-56594-9
  • ウォーターマーク付、 DRMフリー
  • ファイル形式: PDF, EPUB
  • どの電子書籍リーダーからでもすぐにお読みいただけます。
  • ご購入後、すぐにダウンロードしていただけます。
ハードカバー ¥30,887
価格の適用国: Japan (日本円価格は個人のお客様のみ有効) (小計)
  • ISBN 978-4-431-56592-5
  • 個人のお客様には、世界中どこでも配送料無料でお届けします。
  • Usually dispatched within 3 to 5 business days.
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書誌情報

Bibliographic Information
Book Title
VLSI Design and Test for Systems Dependability
Editors
  • Shojiro Asai
Copyright
2019
Publisher
Springer Japan
Copyright Holder
Springer Japan KK, part of Springer Nature
イーブック ISBN
978-4-431-56594-9
DOI
10.1007/978-4-431-56594-9
ハードカバー ISBN
978-4-431-56592-5
Edition Number
1
Number of Pages
XVII, 800
Number of Illustrations
233 b/w illustrations, 352 illustrations in colour
Topics