Overview
- Comprehensive and detailed coverage making it useful for both the novice and experienced user of the powder diffraction method.
- Serves as a textbook for students or reference for academic and industrial researchers.
- Major revisions include:
- expanded treatment of non-crystallographic symmetry
- brief introductions to the total scattering analysis and non-ambient powder diffractometry
- basics of quantitative analysis using the Rietveld method, including determination of amorphous content
- addition of a difficult pseudo-symmetric indexing case
- expanded coverage of direct space structure solution techniques
- an introduction to the mechanism of constraints, restraints and rigid bodies and a new example of structure solution of a pharmaceutical compound
- additional problems to help in assessment of students’ progress.
- Includes supplementary material: sn.pub/extras
- Request lecturer material: sn.pub/lecturer-material
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Table of contents (25 chapters)
Keywords
About this book
Reviews
From a review of the first edition:
“The book is well written and organized. The authors’ enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely. As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. The sections are also ideal for more advanced coursework at the graduate level. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book.” - Materials Today, July/August 2004
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Authors and Affiliations
Bibliographic Information
Book Title: Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition
Authors: Vitalij K. Pecharsky, Peter Y. Zavalij
DOI: https://doi.org/10.1007/978-0-387-09579-0
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag US 2009
Softcover ISBN: 978-0-387-09578-3Published: 26 November 2008
eBook ISBN: 978-0-387-09579-0Published: 24 November 2008
Edition Number: 2
Number of Pages: XXIV, 744
Topics: Physical Chemistry, Characterization and Evaluation of Materials, Crystallography and Scattering Methods, Atomic/Molecular Structure and Spectra, Condensed Matter Physics