MRS Advances - Call for Papers for Materials dynamics study via in situ transmission electron microscopy and spectroscopy

This MRS Advances special issue will share the latest research on employing in situ electron microscopy and spectroscopy techniques to study diverse functional, energy, and structural materials and device systems. Recent advancements in these techniques have expanded the possibilities of transmission electron microscopy (TEM) experiments, allowing for the observation of phase transitions, electrochemical processes, and other dynamic processes to understand device operation mechanisms in their proposed working environments. Progress in advanced spectroscopy, electron detector, and cryogenic microscopy techniques has enabled higher spatial and energy resolution and lower electron doses, particularly beneficial for studying beam sensitive materials like quantum materials, 2D materials, batteries, and soft matter.

Submission Deadline: October 15, 2024

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