The Effect of Rare Earth Metal Doping in Bi2/3Cu3Ti4O12 Ceramic on Microstructure, Dielectric and Electrical Properties
Authors (first, second and last of 7)
Transactions on Electrical and Electronic Materials (Trans. Electr. Electron. Mater. : TEEM) enables professionals in research and industry to keep track of up-to-date developments in Electrical and Electronic Materials fields and their importance for future developments and success.
This journal contributes toward development and propagation of science and technology regarding electrical․electronic materials, and also makes contribution toward scientific technical promotion and national industrial development.
Transactions on Electrical and Electronic Materials is published 6 times a year.
Journal information
- Editor-in-Chief
-
- Yong-Hoon Kim
- Publishing model
- Hybrid (Transformative Journal). How to publish with us, including Open Access
Journal metrics
- 22 days
- Submission to first decision (Median)
- 25,138 (2021)
- Downloads
Latest issue
Latest articles
-
-
Performance Analysis of AlGaN MOSHEMT Based Biosensors for Detection of Proteins
Authors (first, second and last of 5)
-
A Review on p-Type Tunnel Oxide Passivated Contact (TOPCon) Solar Cell
Authors (first, second and last of 8)
-
-
Electrical Characteristics of High-Performance Ultrasonic Transducer for Non-Destructive Testing
Authors (first, second and last of 7)
Journal updates
View all updatesSocieties, partners and affiliations
About this journal
- Electronic ISSN
- 2092-7592
- Print ISSN
- 1229-7607
- Co-Publisher information
- The Korean Institute of Electrical and Electronic Material Engineers
- Abstracted and indexed in
-
- Baidu
- CLOCKSS
- CNKI
- CNPIEC
- Dimensions
- EBSCO Discovery Service
- EI Compendex
- Emerging Sources Citation Index
- Google Scholar
- INSPEC
- Korea Citation Index (KCI)
- Naver
- OCLC WorldCat Discovery Service
- Portico
- ProQuest-ExLibris Primo
- ProQuest-ExLibris Summon
- SCImago
- SCOPUS
- Semantic Scholar
- TD Net Discovery Service
- UGC-CARE List (India)
- Wanfang
- Copyright information
-
© The Korean Institute of Electrical and Electronic Material Engineers