Editors

Editor-in-Chief:

Zhanhu Guo, University of Tennessee, Knoxville, USA


Associate Editors:

Junwei Gu, Northwestern Polytechnical University, China

Roberto Scaffaro, University of Palermo, Italy

Lu Shao, Harbin Institute of Technology, China

Ning Wang, Hainan University and University of Electronic Science and Technology of China, China

Evan K. Wujcik, The University of Alabama, USA

Editorial Board:

Antonio Abate, Helmholtz-Zentrum Berlin, Germany; Ramazan Asmatulu, Wichita State University, USA; Juan Ruso Beiras, University of Santiago de Compostela (USC), Spain; Robert Brull, Fraunhofer Institute for Durability and System Reliability LBF, Germany; Dapeng Cao, Beijing University of Chemical Technology, China; Shougang Chen, Ocean University of China, China; Yuan Chen, The University of Sydney, Australia; Daniel Choi, Masdar Institute, UAE; Henry A. Colorado, Universidad de Antioquia, Colombia; Ai Du, Tongji University, China; Runhua Fan, Shanghai Maritime University, China; Chuanliang Feng, Shanghai Jiaotong University, China; Jihua Gou, University of Central Florida, USA; Hongbo Gu, Tongji University, China; Zhiyong Gu, University of Massachusetts Lowell, USA; Nikhil Gupta, New York University, USA; Vinod Kumar Gupta, University of Johannesburg, South Africa; Xiao (Matthew) Hu, Nanyang Technological University, Singapore; Jijun Huang, The University of Chinese Academy of Sciences, China; Jin Huang, Southwest University, China; Xingyi Huang, Shanghai Jiao Tong University, China; Ju-Won Jeon, The University of Alabama, USA; Jenna Jia, University of Regina, Canada; Bo Jiang, Harbin Institute of Technology, China; Dawei Jiang, Northeast Forestry University, China; Qinglong Jiang, Argonne National Laboratory, USA; Zhongyi Jiang, Tianjin University, China; Hak-Sung Kim, Hanyang University, Republic of Korea; Jie Kong, Northwestern Polytechnical University, China; Xiaolin Li, Pacific Northwest National Laboratory, USA; Yan Li, Tongji University, China; Yao Li, Harbin Institute of Technology, China; Ying Li, Texas A&M University, USA; Hong Lin, Tsinghua University, China; Hongfei Lin, Washington State University, USA; Chuntai Liu, Zhengzhou University, China; Jiurong Liu, Shandong University, China; Yuyan Liu, Harbin Institute of Technology, China; Zhen Liu, Frostburg State University, USA; Na Luna Lu, Purdue University, USA; Weibang Lu, Chinese Academy of Sciences, China; Zhengtang Luo, The Hong Kong University of Science and Technology, Hong Kong; Nurxat Nuraje, Texas Tech University. Lubbock, USA; Dermot O'Hare, University of Oxford, UK; Kristiina Oksman, Luleå University of Technology, Sweden; Giuseppe Palmese, Drexel University, USA; Elizabeth Podlaha, Clarkson University, USA; Vilas G. Pol, Purdue University, USA; Faxiang Qin, Zhejiang University; Zuzeng Qin, Guangxi University, China; Bin Qiu, Beijing Forestry University, China; Jong Eun Ryu, Indiana University, Indianapolis (IUPUI), USA; Changyu Shen, Zhengzhou University, China; T. D. Shen, Yanshan University, China; Haixiang Song, Anyang Institute of Technology, China; A. Subramania, Pondicherry University, India; Luyi Sun, University of Connecticut, USA; Rong Sun, Chinese Academy of Sciences, China; Sruthi Tadakamalla, Sep-Pro Systems Inc., USA; Bo Wang, Dalian University of Technology, China; Chun H. Wang, University of New South Wales, Australia; Qiang Wang, Beijing Forestry University, China; Zhe Wang, Xavier University of Louisiana, USA; Huige Wei, Tianjin University of Science and Technology, China; Di Wu, Washington State University, USA; Deying Xia, Carl Zeiss Microscopy, LLC, USA; Chao Yan, Jiangsu University of Science and Technology; Guang Yang, Huazhong University of Science & Technology; Liu Yang, University of Strathclyde, UK; Peng Yang, Shaanxi Normal University, China; Wei Yang, Sichuan University, China; Narendranath Yerra, JGC America Inc., USA; Xiaowei Yin, Northwestern Polytechnical University, China; Robert Young, Lancaster University, UK; Guoping Zhang, Chinese Academy of Sciences, China; Qiuyu Zhang, Northwestern Polytechnical University, China; Xin Zhang, Pacific Northwest National Laboratory, USA; Chunyi Zhi, City University of Hong Kong, Hong Kong; Haizheng Zhong, Beijing Institute of Technology, China; Katie Zhong, Washington State University, USA; Jack Jiahua Zhu, The University of Akron, USA; Yutian Zhu, Chinese Academy of Sciences, China.

Promotional & Coordinating Offices:

Ge Yang, Chongqing and Hainan, China
Jiangchuan Zhou, Chongqing, China