Editors

Editors:

Jan Belis, Ghent University, Belgium
Christian Louter, Delft University of Technology, The Netherlands
Jens Henrik Nielsen, Technical University of Denmark, Kongens Lyngby, Denmark
Mauro Overend, Delft University of Technology, The Netherlands
Jens Schneider, Technical University of Darmstadt, Germany

 

Editorial Board:

Antti Aronen, Glaston Finland Oy, Tampere, Finland
Claudio Amadio, Università di Trieste, Italy
Chiara Bedon, Universitá di Trieste, Italy
Shunhua Chen, Sun Yat-sen University, Zhuhai, China
Suwen Chen, Tongji University, Shanghai, China
Paulo Cruz, University of Minho, Braga, Portugal
Martina Eliasova, Czech Technical University in Prague, Czech Republic
Fabio Favoino, Politecnico di Torino, Turin, Italy
Laura Galuppi, University of Parma, Italy
Qian Jin, Tongji University, Shanghai, China
Stefan Karlsson, RISE Research Institutes of Sweden, Göteborg, Sweden
Cenk Kocer, The University of Sydney, NSW, Australia
Stefan Kolling, Technische Hochschule Mittelhessen, Giessen, Germany
John Kooymans, Read Jones Christoffersen Ltd., Toronto, ON, Canada
Andreas Luible, Lucerne University of Applied Science and Arts, Luzern, Switzerland
Gergely Molnár, LaMCoS, INSA Lyon, France
Stephen Morse, Michigan Technological University, Houghton, MI, USA
J. David Musgraves, Rochester Precision Optics, West Henrietta, NY, USA
Jürgen Neugebauer, Joanneum University of Applied Sciences, Graz, Austria
James O’Callaghan, Eckersley O’Callaghan, London, UK
Nina Penkova, University of Chemical Technology and Metallurgy, Sofia, Bulgaria
Alejandro Prieto Hoces, Universidad Diego Portales, Chile
João Ramôa Correia, Universidade de Lisboa, Portugal
Manuel Santarsiero,  (DETEC), Estavayer-le-Lac, Switzerland
Geralt Siebert, Universität der Bundeswehr München, Germany
Marc Vandebroek, Thomas More University of Applied Sciences, Mechelen, Belgium
Jian Yang, Shanghai Jiao Tong University, Shanghai, China
Marco Zaccaria, AGC Glass Europe - Technovation, Gosselies, Belgium

 

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