Editors

Editor-in-Chief:

Çetin Kaya Koç
University of California, Santa Barbara, USA
koc@cs.ucsb.edu

Steering Committee:

Çetin Kaya Koç
University of California, Santa Barbara, USA

Christof Paar
Ruhr University of Bochum, Germany

Jean-Jacques Quisquater
Université catholique de Louvain, Belgium

Ingrid Verbauwhede
Katholieke Universiteit Leuven, Belgium

Editorial Board:

Lejla Batina, Radboud University Nijmegen, The Netherlands

Guido Marco Bertoni, ST Microelectronics, Italy

Brice Colombier, University of Saint-Etienne, France

Ricardo Dahab, University of Campinas, Brazil

Jean-Luc Danger, Télécom ParisTech, France

Thomas Eisenbarth, Worcester Polytechnic Institute, USA

Serdar Süer Erdem, Gebze Technical University, Turkey

Houda Ferradi, The Hong Kong Polytechnic University, Hong Kong

Wieland Fischer, Infineon Technologies, Neubiberg, Germany

Krzysztof Gaj, George Mason University, USA

Rémi Géraud-Stewart, ENS, France

Tim Güneysu, Ruhr University of Bochum, Germany

Sylvain Guilley, Télécom ParisTech, France

Anwar Hasan, University of Waterloo, Canada

Naofumi Homma, Tohoku University, Japan

Marc Joye, Technicolor, France

Tanja Lange, Eindhoven University of Technology, The Netherlands

Zhe Liu, Nanjing University of Aeronautics and Astronautics, China

Patrick Longa, Microsoft Research, USA

Roel Maes, Intrinsic-ID, The Netherlands

Amir Moradi, Ruhr-University of Bochum, Germany

Debdeep Mukhopadhyay, Indian Institute of Technology Kharagpur, India

David Naccache, École normale supérieure, Paris, France

Elisabeth Oswald, University of Bristol, UK

Emmanuel Prouff, Morpho, Issy-les-Moulineaux, France

Francisco Rodríguez Henríquez, CINVESTAV, IPN, Mexico

Pankaj Rohatgi, Cryptography Research, USA

Ulrich Rührmair, Ludwig Maximilian University Munich, Germany; University of Connecticut, USA

Kazuo Sakiyama, The University of Electro-Communications, Japan

Erkay Savaş, Sabanci University, Turkey

Patrick Schaumont, Virginia Tech, USA

Werner Schindler, Bundesamt für Sicherheit in der Informationstechnik, Germany

Peter Schwabe, Radboud University, The Netherlands

Jean-Pierre Seifert, TU Berlin, Germany

François-Xavier Standaert, Université catholique de Louvain, Belgium

Tsuyoshi Takagi, University of Tokyo, Japan

Damien Vergnaud, École normale supérieure, Paris, France