Editors

Editor-in-Chief

Eun-Soo Kim, Kwangwoon University, Korea, Republic Of

Editorial Board

AbdelHadi Kassiba, Université du Maine, France
Akira Ishibashi, Hokkaido University, Japan
Alexander Govorov, Ohio University, United States
Andreas Kolb, University of Siegen, Germany
Byoungho Lee, Seoul National University, Korea, Republic Of
Cardinal Warde, Massachusetts Institute of Technology, United States
Ching-Ting Lee, National Cheng-Kung University, Taiwan
Christian Wöhler, Technical University of Dortmund, Germany
Chunlei Guo, University of Rochester, United States
Dongfeng Xue, Chinese Academy of Sciences, China
Eli Brenner, Vrije Universiteit, Netherlands
Eva Maria Pellicer Vilà, Universitat Autònoma de Barcelona, Spain
Gan Moog Chow, National University of Singapore, Sinapore
Gang-Yu Liu, University of California, Davis, USA
Georgios A. Triantafyllidis, Applied Informatics and Multimedia, Greece
Hiroshi Yoshikawa, Nihon University, Japan
Ioan Baldea, Universität Heidelberg, Germany
Janusz Konrad, Boston University, United States
John Caulfield, Diversified Research Corporation, United States
Jordi Sort Viñas, Universitat Autònoma de Barcelona, Spain
Joseph Rosen, Ben-Gurion University of the Negev, Israel
Kelvin Wagner, University of Colorado, United States
Kwang-Hoon Sohn, Yonsei University, Korea, Republic Of
Lambertus Hesselink, Stanford University, United States
Manuel Martinez-Corral, University of Valencia, Spain
Martin J. Richardson, De Montfort University, United Kingdom
Masayoshi Higuchi, National Institute for Material Science, Japan
Mikael Sjödahl, Luleå University of Technology, Sweden
Nam Kim, Chungbuk National Univ., Korea, Republic Of
Nickolas S. Sapidis, University of Western Macedonia, Greece
Osamu Matoba, Kobe University, Japan
Pietro Ferraro, Istituto Nazionale di Ottica Applicata, Italy
Pooi See Lee, Nanyang Technological University, Singapore
Simon Ringer, University of Sydney, Australia
Stefan Seeger, University of Zurich, Switzerland
Takashi Kawai, Waseda University, Japan
Takeharu Haino, Hiroshima University, Japan
Thomas Naughton, National University of Ireland Maynooth, Ireland
Tiejun Huang, Peking University, China
Ting-Chung Poon, Virginia Tech, United States
Tomohiro Amemiya, Tokyo Institute of Technology, Japan
Toshio Honda, Chiba University, Japan
Toyohito Yatagai, Utsunomiya University, Japan
Vladimir V. Petrov, Saratov State University, Russian Federation
Wolfgang Osten, University of Stuttgart, Germany
Xiao-Tao Hao, Shandong University, China
Xingjun Wang, Tsinghua University, China
Yi-Pai Huang, National Chiao Tung University, Taiwan
Yonggang Zhao, Tsinghua University, China
Yongli Gao, University of Rochester, United States
Yong Zhang, University of North Carolina at Charlotte, United States
Yo-Sung Ho, Gwangju Institute of Science and Technology, Korea, Republic Of
Zhiming Wang, University of Electronic Science and Technology of China, China

Managing Editor
Jihoon Lee, Kwangwoon University, Korea, Republic Of