MAPAN - MAPAN Closed Special Issue
Title: Special Issue on Measurement and Metrology in Advanced Manufacturing Processes (pp 703- 890)
Guest Editors: P. K. Kankar, System Dynamics Lab, Department of Mechanical Engineering, Indian Institute of Technology Indore, Indore, India; G. Moona, Length, Dimension and Nano Metrology, CSIR-National Physical Laboratory, New Delhi, India; and K. A. Desai, Department of Mechanical Engineering, Indian Institute of Technology Jodhpur, Jodhpur, India
Title: Special Issue on Certified Reference Material for Scientific and Industrial Application
Guest Editors: SP Singh, CSIR-National Physical Laboratory, New Delhi, India; Jariya Buajarern, NIMT-National Institute of Metrology Thailand, Pathum Thani, Thailand; Leena Joseph, Department of Technology and Quality Management, Sree Chitra Tirunal Institute for Medical Sciences and Technology (SCTIMST), Thiruvananthapuram, India
Title: Special Issue on Advances in Sensors and Measurements for Metrological Applications
Guest Editors: K.P. Chaudhary, Maharaja Surajmal Institute of Technology, New Delhi, India; P K Dubey, CSIR-National Physical Laboratory, New Delhi, India; Ajay Gahlot, Maharaja Surajmal Institute of Technology, New Delhi, India; Aman Dahiya, Maharaja Surajmal Institute of Technology, New Delhi, India
Title: Special Issue on Redefinition of SI Units and Its Implications
Guest Editors: Stephan Schlamminger, National Institute of Standards and Technology (NIST), Gaithersburg, USA; Inseok Yang, Korea Research Institute of Standards and Science (KRISS), Daejeon, Republic of Korea; Harish Kumar, National Institute of Technology, New Delhi, Delhi, India
Title: Special Issue on Uncertainty Evaluation by Monte Carlo Method
Guest Editors: P. Rachakonda, National Institute of Standards and Technology (NIST), Gaithersburg, USA; V. Ramnath, University of South Africa, Pretoria, Gauteng Province, Republic of South Africa; VS Pandey, Department of Applied Sciences, National Institute of Technology, New Delhi, Delhi, India
Title: Advance Radiation Metrology Techniques and Related Applications
Guest Editors: Dr. D. K. Aswal, Bhabha Atomic Research Center, Mumbai, India; Dr. S. K. Jha, Bhabha Atomic Research Center, Mumbai, India; Dr. Aditi C. Patra, Bhabha Atomic Research Center, Mumbai, India