MAPAN - Upcoming Special Issue: Metrological Innovations for Science, Technology and Global Trade
Guest Editors Details:
Dr. Ashok Kumar, Principal Scientist at CSIR-National Physical Laboratory, Delhi, India
Dr. Prakriti Ranajan Bangal, Principal Scientist at CSIR - Indian Institute of Chemical Technology, Hyderabad, India
Dr. Sudhir Kumar Sharma, Principal Scientist at CSIR-National Physical Laboratory, New Delhi, India
Dr. Subhasis Panja, Principal Scientist at CSIR - National Physical Laboratory, India
The MAPAN-Journal of Metrology Society of India, a leading SCI indexed quarterly publication, exclusively devoted to Metrology (Scientific, Industrial or Legal), is being published by Metrology Society of India in collaboration with Springer Nature India Pvt. Ltd.; National Physical Laboratory (NPLI) and Council of Scientific and Industrial Research (CSIR), New Delhi, India. In the past, several theme-based special issues have been published in the journal on various aspects of metrology by eminent Metrologists as Guest Editors.
The journal invites the submission of research communications or technical articles or review articles on topics of current interest. Original work, tutorials and survey papers, which contribute to new knowledge or understanding of any metrology principle, method or technique, are welcome. Papers are considered for publication on the clear understanding that they have not been published previously or submitted to another journal for publication.
This journal is committed to upholding the integrity of the scientific record. As a member of the Committee on Publication Ethics (COPE) the journal will follow the COPE guidelines on how to deal with potential acts of misconduct.
Authors should refrain from misrepresenting research results which could damage the trust in the journal, the professionalism of scientific authorship, and ultimately the entire scientific endeavor. To maintain integrity of the research and its presentation, author should make sure that the manuscript has not been submitted to more than one journal for simultaneous consideration.
All submissions should follow the instructions available at https://www.springer.com/journal/12647/submission- (this opens in a new tab)guidelines (this opens in a new tab)
Submission Link: Paper can be submitted directly on the journal submission portal: https://www.editorialmanager.com/jmsi/default.aspx (this opens in a new tab), under the special issue category.
Submission process: The journal may use software to screen for plagiarism. The papers accepted for publication are subjected to peer review process by 2 reviewers/experts of the subject or by the Guest Editors. Generally, no more than three papers from one institution are permitted, unless it is justified by the Guest Editors and authorized in advance by the journal editorial committee.
Please follow the given steps:
Step I - ‘Does this manuscript belong to a special issue? Yes/No’. Please enter ‘Yes’.
Step II - The author must choose the Special Issue of choice, which will be: “Metrological Innovations for Science, Technology and Global Trade" select the title from the dropdown list
All enquiries regarding the Special issue should be sent to:
Managing Editors: Dr. S. K. Jaiswal; skjaiswal@nplindia.org (this opens in a new tab) or
Dr. Naveen Garg; ngarg@nplindia.org (this opens in a new tab)
Editor-in-Chief: Dr. Sanjay Yadav, syadav@nplindia.org (this opens in a new tab); Springer Nature Contact:
Sonal Choudhary; sonal.choudhary@springernature.com (this opens in a new tab)