MAPAN - Upcoming Special Issue on Measurement and Metrology in Advanced Manufacturing Processes

Submission deadline: January, 2022

Guest Editors:

Dr. Kaushal A Desai

Department of Mechanical Engineering, Indian Institute of Technology Jodhpur Karwad, Jodhpur, Rajasthan, India.

Dr. Gaurav Ameta

Senior Key Expert, Siemens Technology, Princeton, NJ, USA.

Dr. Ms. Girija Moona

Senior Scientist- Length, Dimension and Nano Metrology, Room Number 18, Apex Metrology Laboratory, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi.

Dr Pavan Kumar Kankar

Associate Professor, Department of Mechanical Engineering, Indian Institute of Technology Indore, India