Editors

EDITOR-IN-CHIEF
Dr. Sanjay Yadav, CSIR-National Physical Laboratory, New Delhi, India 

MANAGING EDITORS
Dr. S. K. Jaiswal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Naveen Garg, CSIR-National Physical Laboratory, New Delhi, India 

ASSOCIATE EDITORS
Dr. Ravinder Agarwal, Thapar University, Patiala, Punjab, India
Dr. Ashish Agarwal, CSIR-National Physical Laboratory, New Delhi, India
Dr. Shankar G. Aggarwal, CSIR-National Physical Laboratory, New Delhi, India
Dr. S. K. Jha, Bhabha Atomic Research Centre, Mumbai, India
Dr Harish Kumar, National Institute of Technology, Delhi, India 
Dr. Kamlesh Patel, University of Delhi, New Delhi, India
Dr. Shailesh M Pandey, National Institute of Technology Patna, India
Dr. K.S. Nagla, National Institute of Technology (NIT), Jalandhar, India
Dr. Shanay Rab, University of Brighton, UK
Dr. Devraj Singh, Amity School of Engineering and Technology, Delhi, India
Dr. Sudhir Kumar Sharma, CSIR-National Physical Laboratory, New Delhi, India
Dr. Ciro Alberto Sánchez, National Metrology Institute, Colombia


EDITORAL BOARD
Venugopal Achanta, CSIR-National Physical Laboratory, New Delhi, India
Dr. D. K. Aswal, Bhabha Atomic Research Center, Mumbai, India
Mr. Anil Agarwal, Measurement Science and Standards, National Research Council, Canada
Dr. Wolfram Bremser, BAM Federal Institute for Materials Research & Testing (BAM), Berlin, Germany
Dr. Seng-Jue Chen, CMS/ITRC, Taiwan
Dr. K.P Chaudhary, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India
Dr. Victoria Anne Coleman, National Measurement Institute (NMI), West Lindfield NSW, Australia  
Dr. Stuart Davidson, National Physical Laboratory (NPL), UK 
Dr. Joachim Fischer, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany 
Dr. Peter Fisk, National Measurement Institute (NMI), West Lindfield NSW, Australia
Dr. J. C. Torres-Guzmán, Centro Nacional de Metrología (CENAM), Mexico
Prof. Abid Haleem, Faculty of Engineering and Technology, Jamia Millia Islamia, New Delhi, India
Dr. T.J.B.M. Janssen, National Physical Laboratory, Middlesex, UK
Dr. Tokihiko Kobata, National Metrology Institute of Japan (NMIJ), lbaraki, Japan 
Dr.  R. K. Kotnala, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India 
Mr. Anil Kumar, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Ma Liandi, National Institute of Metrology (NIM), Beijing, China 
Dr. Thomas Liew, Agency for Science, Technology and Research (A*STAR), Singapore
Dr. Martin Milton, BIPM, France
Dr. Ranjana Mehrotra, CSIR–National Physical Laboratory, New Delhi, India 
Dr. B. P. Patel, Indian Institute of Technology Delhi, India
Dr. Vinay Shankar Pandey, National Institute of Technology (NIT), Delhi
Dr. A. Sengupta, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India 
Dr. Rajveer Singh, Ambedkar Institute of Advanced Communication Technologies and Research, (AIACTR), New Delhi, India
Dr. J.H. Shaw, CMS/ITRI, Taiwan
Mr.  A. K. Saxena, Ex-scientist, CSIR–National Physical Laboratory, New Delhi, India
Dr. Ciro Alberto Sánchez, National Metrology Institute, Colombia
Dr. Toshiyuki Takatsuji, National Metrology Institute of Japan (NMIJ), lbaraki, Japan  
Dr. Takashi Usuda, National Metrology Institute of Japan (NMIJ), lbaraki, Japan 
Dr. Costas Varotsos, National and Kapodistrian University of Athens, Athens, Greece 
Mr. Ian Veldman, National Metrology Institute of South Africa (NMISA), Pretoria, South Africa 
Dr. Sam-Yong Woo, Korea Research Institute of Standards and Science (KRISS), Daejeon, Republic of Korea