Editors
Editor-in-Chief
Xuemin (Sherman) Shen, University of Waterloo, Canada
sshen@uwaterloo.ca
Associate Editors
Luca Bedogni, University of Modena and Reggio Emilia, Italy
Jiannong Cao, Hong Kong Polytechnic University, China
Shan Chang, Donghua University, China
Nan Cheng, Xidian University, China
Francesco Chiti, Università degli Studi di Firenze, Italy
Sajal Das, University Texas at Arlington, USA
Yong Ding, Guilin University of Electronic Technology, China
Khalid Elgazzar, University of Ontario Institute of Technology, Canada
Nelson L. S. da Fonseca, State University of Campinas, Brazil
Jie Gao, Marquette University, USA
Khaled Hatem Almotairi, Umm Al-Qura University, Saudi Arabia
Peter Langendoerfer, IHP Microelectronics, Germany
Lei Lei, University of Guelph, Canada
Hongwei Li, University of Electronic Science and Technology of China, China
Lu Liu, University of Derby, UK
Rongxing Lu, Nanyang Technological University, Singapore
Mohamed M. E. A. Mahmoud, Tennessee Tech University, USA
Vojislav B. Misic, University of Manitoba, Canada
Benedetta Picano, Università degli Studi di Firenze, Italy
Periasamy Prakasam, Vellore Institute of Technology, India
Wei Quan, Beijing Jiaotong University, China
Zheng Qin, Hunan University, China
Ju Ren, Central South University, China
Pradip Kumar Sharma, University of Aberdeen, UK
Mohammad Shojafar, University of Surrey, UK
Mi Wen, Shanghai University of Electric Power, China
Shen Yan, Huawei Technologies Co., Ltd.
Kuan Zhang, University of Nebraska-Lincoln, USA
Shan Zhang, Beihang University, China
Yongbing Zhang, University of Tsukuba, Japan
Haojin Zhu, Shanghai Jiao Tong University, China
