Editors

Editor-in-Chief

Xuemin (Sherman) Shen, University of Waterloo, Canada
xshen@bbcr.uwaterloo.ca

Associate Editors

Luca Bedogni, University of Modena and Reggio Emilia, Italy

Jiannong Cao, Hong Kong Polytechnic University, China

Shan Chang, Donghua University, China

Nan Cheng, Xidian University, China

Francesco Chiti, Università degli Studi di Firenze, Italy

Sajal Das, University Texas at Arlington, USA

Yong Ding, Guilin University of Electronic Technology, China

Khalid Elgazzar, University of Ontario Institute of Technology, Canada

Nelson L. S. da Fonseca, State University of Campinas, Brazil

Khaled Hatem Almotairi, Umm Al-Qura University, Saudi Arabia

Peter Langendoerfer, IHP Microelectronics, Germany

Lei Lei, University of Guelph, Canada

Hongwei Li, University of Electronic Science and Technology of China, China

Lu Liu, University of Derby, UK

Rongxing Lu, Nanyang Technological University, Singapore

Mohamed M. E. A. Mahmoud, Tennessee Tech University, USA

Vojislav B. Misic, University of Manitoba, Canada

Benedetta Picano, Università degli Studi di Firenze, Italy

Wei Quan, Beijing Jiaotong University, China

Zheng Qin, Hunan University, China

Ju Ren, Central South University, China

Mohammad Shojafar, University of Surrey, Uk

Mi Wen, Shanghai University of Electric Power, China

Shen Yan, Huawei Technologies Co., Ltd.

Kuan Zhang, University of Nebraska-Lincoln, USA

Shan Zhang, Beihang University, China

Yongbing Zhang, University of Tsukuba, Japan

Haojin Zhu, Shanghai Jiao Tong University, China