This journal reports on several growing areas of physical and computer research. From its inception it has covered the design and development of instrumentation and systems for automatic measurement. Its scope has broadened to include automation based on laser and optoelectronic technologies, laser and non-linear optics, new information technologies and problem-oriented computer systems. Today, this Russian Academy of Sciences journal presents timely results of basic and applied research on Solid state physics, optics and holography in applications to computers and measurement techniques; Physical aspects of micro- and optoelectronics; Optical information technologies, systems and components; Laser physics applications; Automated measurement systems; Automation of scientific R & D and industrial automation; Real-time image analysis and synthesis systems; AI methods and systems in scientific research and management; Computer networks and data transmission systems; Computer-aided VLSI design and more.

PEER REVIEW

Optoelectronics, Instrumentation and Data Processing is a peer reviewed journal. We use a single blind peer review format. Our team of reviewers includes over 100 experts. The average period from submission to first decision in 2018 was 2 months, and that from first decision to acceptance was 8 months. The rejection rate for submitted manuscripts in 2018 was 30%. The final decision on the acceptance of an article for publication is made by the Editorial Board.

Any invited reviewer who feels unqualified or unable to review the manuscript due to the conflict of interests should promptly notify the editors and decline the invitation. Reviewers should formulate their statements clearly in a sound and reasoned way so that authors can use reviewer’s arguments to improve the manuscript. Personal criticism of the authors must be avoided. Reviewers should indicate in a review (i) any relevant published work that has not been cited by the authors, (ii) anything that has been reported in previous publications and not given appropriate reference or citation, (ii) any substantial similarity or overlap with any other manuscript (published or unpublished) of which they have personal knowledge.

  • Covers instrumentation and systems for automatic measurement, and automation based on laser and optoelectronic technologies
  • Presents basic and applied research on Solid state physics, optics and holography in applications to computers and measurement techniques; Physical aspects of micro- and optoelectronics; Optical information technologies, systems and components; and much more
  • Associated with the Russian Academy of Sciences

Journal information

Editor-in-Chief
  • Anatolii M. Shalagin
Publishing model
Subscription

Journal metrics

4,132 (2019)
Downloads

Latest articles

About this journal

Electronic ISSN
1934-7944
Print ISSN
8756-6990
Abstracted and indexed in
  1. Astrophysics Data System (ADS)
  2. CNKI
  3. Dimensions
  4. EBSCO Discovery Service
  5. EI Compendex
  6. Emerging Sources Citation Index
  7. Google Scholar
  8. INIS Atomindex
  9. INSPEC
  10. Institute of Scientific and Technical Information of China
  11. Japanese Science and Technology Agency (JST)
  12. Naver
  13. OCLC WorldCat Discovery Service
  14. ProQuest-ExLibris Primo
  15. ProQuest-ExLibris Summon
  16. SCImago
  17. SCOPUS
  18. UGC-CARE List (India)
  19. WTI Frankfurt eG
Copyright information

Rights and permissions

Springer policies

© Allerton Press, Inc.