Semiconductors is a journal that сovers semiconductor theory, transport phenomena in semiconductors, optics, magnetooptics, and electrooptics of semiconductors, devices based on semiconductors and nanostructures including lasers, semiconductor surface physics, and structural defects in semiconductors.

PEER REVIEW

Semiconductors is a peer reviewed journal. We use a single blind peer review format. Our team of reviewers includes over 140 experts from 7 countries (Russia, Ukraine, Belorussia, Germany, France, UK, USA). The average period from submission to first decision in 2018 was 14 days, and that from first decision to acceptance was 21 days. The rejection rate for submitted manuscripts in 2018 was 18%. The final decision on the acceptance of an article for publication is made by the Editor-in-Chief or the Deputy Editor-in-Chief.

Any invited reviewer who feels unqualified or unable to review the manuscript due to the conflict of interests should promptly notify the editors and decline the invitation. Reviewers should formulate their statements clearly in a sound and reasoned way so that authors can use reviewer’s arguments to improve the manuscript. Personal criticism of the authors must be avoided. Reviewers should indicate in a review (i) any relevant published work that has not been cited by the authors, (ii) anything that has been reported in previous publications and not given appropriate reference or citation, (ii) any substantial similarity or overlap with any other manuscript (published or unpublished) of which they have personal knowledge.

  • Presents the most important work in semiconductor research in the countries of the former Soviet Union
  • Covers semiconductor theory, transport phenomena in semiconductors, optics, magneto-optics, and electro-optics of semiconductors, semiconductor surface physics, and more
  • Features an extensive book review section
Editor-in-chief
  • Robert A. Suris
Usage
Downloads: 30,352 (2018)
Impact
Impact factor: 0.691 (2018)
Five year impact factor: 0.595 (2018)
Publishing model
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Articles

About this journal

Electronic ISSN
1090-6479
Print ISSN
1063-7826
Abstracted and indexed in
  1. Chemical Abstracts Service (CAS)
  2. Current Contents Collections / Electronics & Telecommunications Collection
  3. Current Contents/Physical, Chemical and Earth Sciences
  4. EBSCO Discovery Service
  5. Gale
  6. Gale Academic OneFile
  7. Gale InfoTrac
  8. Google Scholar
  9. INIS Atomindex
  10. INSPEC
  11. Institute of Scientific and Technical Information of China
  12. Japanese Science and Technology Agency (JST)
  13. Journal Citation Reports/Science Edition
  14. Naver
  15. OCLC WorldCat Discovery Service
  16. ProQuest Advanced Technologies & Aerospace Database
  17. ProQuest Central
  18. ProQuest SciTech Premium Collection
  19. ProQuest Technology Collection
  20. ProQuest-ExLibris Primo
  21. ProQuest-ExLibris Summon
  22. SCImago
  23. SCOPUS
  24. Science Citation Index
  25. Science Citation Index Expanded (SciSearch)
  26. WTI Frankfurt eG
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