Editors
Editor-in-Chief:
S.Y. Kung
Dept. of Electrical Engineering, Princeton University, NJ, USA
Co-Editor-in-Chief:
Jarmo Takala
Tampere University, Finland
John McAllister
Queen's University Belfast
Editorial Board:
Tülay Adali, University of Maryland, Baltimore County, USA
Kubilay Atasu, IBM Zurich Research Laboratory, Switzerland
Oscar Au, Hong Kong University of Science and Technology, Hong Kong
Neal Bambha, US Army Research Laboratory, USA
Magdy A. Bayoumi, University of Louisiana at Lafayette, USA
Shuvra Bhattacharyya, University of Maryland, USA
Holger Blume, Leibniz Universität Hannover, Germany
Jani Boutellier, University of Vaasa, Finland
Andreas Burg, EPFL, Switzerland
Wayne Burleson, University of Massachusetts, USA
Francky Catthoor, Katholieke Universiteit Leuven/IMEC, Belgium
Joseph Cavallaro, Rice University, USA
Chaitali Chakrabarti, Arizona State University, USA
S.C. Chan, University of Hong Kong, Hong Kong
Nitin Chandrachoodan, Indian Institute of Technology, Madras, India
Rong Chen, University of Maryland, Baltimore County, USA
Liang-Gee Chen, National Taiwan University, Taiwan
Sao-Jie Chen, National Taiwan University, Taiwan
Xiaoheng Chen, SanDisk Corporation, USA
Yen-Kuang Chen, Intel Corporation, USA
Albert M. K. Cheng, University of Houston, USA
Xiaochun Cheng, Swansea University, UK
Jen-Tzung Chien, National Chiao Tung University, Taiwan
Ching-Te Chiu, National Tsing Hua University, Taiwan
Konstantinos I. Diamantaras, Aristotle University of Thessaloniki, Greece
Brian L. Evans, University of Texas at Austin, USA
Lin Feng, Nanyang Technological University, Singapore
Mario Garrido, Linköping University, Sweden
Xiaodong Gu, Fudan University, China
Ling Guan, Ryerson Polytechnic University, Canada
Yun He, Tsinghua University, China
Yo-Sung Ho, Gwangju Institute of Science and Technology, Republic of Korea
Sangjin Hong, State University of New York at Stony Brook, USA
Y.H. Hu, University of Wisconsin, USA
Mohammad Ibrahim, De Montfort University, UK
Jack Jean, Wright State University, USA
Y.C. Jenq, Portland State University, USA
Hiroshi Kawaguchi, Kobe University, Japan
Changick Kim, KAIST, Republic of Korea
Branislav Kisacanin, Interphase, USA
Shang-Hong Lai, National Tsing Hua University, Taiwan
Gwo Lee, National Cheng Kung University, Taiwan
Eung-Joo Lee, University of Arizona, USA
Paul P. K. Lee, ITT Corp, USA
Ta-Sung Lee, National Chiao Tung University, Taiwan
Shipeng Li, iFLYTEK Co. Ltd., China
Zhu Li, University of Missouri-Kansas City, USA
Chang Hong Lin, National Taiwan University of Science and Technology, Taiwan
Wayne Luk, Imperial College London, UK
Man Wai Mak, Hong Kong Polytechnic University, Hong Kong
Elias Manolakos, University of Athens, Greece
John McAllister, Queen's University Belfast, UK
David J. Miller, Pennsylvania State University, USA
Jean-François Nezan, INSA de Rennes, France
Amos R. Omondi, SUNY Korea, Republic of Korea
Francesca Palumbo, University of Sassari, Italy
Keshab K. Parhi, University of Minnesota, USA
Guillermo Payá Vayá, Leibniz Universität Hannover, Germany
Maxime Pelcat, IETR, France; INSA de Rennes, France
Andy D. Pimentel, University of Amsterdam, Netherlands
Meikang Qiu, Texas A&M University, USA
Michael Schulte, University of Wisconsin-Madison, USA
Edwin Sha, University of Notre Dame, USA
Olli Silven, University of Oulu, Finland
Wan Chi Siu, Hong Kong Polytechnic University, Hong Kong
Ming Ting Sun, University of Washington, USA
Earl E. Swartzlander, Jr., University of Texas, Austin, USA
Yap-Peng Tan, Nanyang Technological University, Singapore
Lothar Thiele, Swiss Federal Institute of Technology, Switzerland;
Pei-Yun Tsai, National Central University, Taiwan
Senem Velipasalar, Syracuse University, USA
Chua-Chin Wang, National Sun Yat-Sen University, Taiwan
Jiangtao Wen, Tsinghua University, China
Roger Woods, Queen's University of Belfast, UK
An-Yeu Wu, National Taiwan University, Taiwan
Zhiyuan Yan, Lehigh University, USA
Kung Yao, UCLA, USA
Kim Hui Yap, Nanyang Technological University, Singapore
Chang D. Yoo, KAIST, Republic of Korea
Bo Yuan, Rutgers University, USA
Qian Zhang, Hong Kong University of Science and Technology, Hong Kong
Tong Zhang, Rensselaer Polytechnic Institute, USA
Karl-Heinz Zimmermann, Technical University of Hamburg-Harburg, Germany
Area Editor: Big Data Security Track
Meikang Qiu, Texas A&M University, USA