Optical and Quantum Electronics - CALL FOR PAPERS: Integrated Optoelectronic Devices for Automatic Failure Analysis in Industry 4.0
Industry 4.0 major concern is to increase the throughput of automation where sensors play a key role in managing efficient automated control systems. Digitalization in critical failure analysis can promisingly improve mobility. Integrated optoelectronic devices are recognizably a leading-edge technology that focuses on detecting and controlling light. Optoelectronics include devices that convert light energy to electricity or vice-versa. These devices account for a major share of semiconductors utilizations across various verticals. Optoelectronic devices have created a huge impact in wider industries and applications in healthcare, automotive, telecommunication, LEDs, sensors, optical fibers, energy, and many more because of their high performance and bandwidth, increased lifetime of the product, and efficient energy consumption features. The demand for integrated optoelectronic devices is raised with the increased need for smart electronic devices which highlights the essentiality to identify appropriate failure analysis mechanisms.
In addition, failure analysis and safety of integrated optoelectronic devices are ever-raising challenges. The advanced failure analysis mechanisms of a critical component in original equipment manufacturers (OEM) are necessary for the services and maintenance of devices in various industries. Evolving automatic failure analysis can better aid to recognize the central origin of device failure and mitigate the failure of devices and minimize the repetition of faults in the future. Automation in failure analysis creates a platform of unified, end-to-end testing solutions for detecting manufacturing defects, assembly and design errors, incompetent quality assurance and maintenance, unpredicted operating circumstances in industries, etc., Emerging trends in automatic failure analysis have remarkable advantages over conventional processes. Hence flexible design, fabrication, and implementation of optoelectronic sensors, devices, and systems contribute to implanting new industrial concepts, focusing on physical sensing, chemical sensing, and sensor multiplexing to attain advanced automatic analysis of failure rate with high accuracy.
This special issue outlines the significance of automatic failure analysis in integrated optoelectronic devices for advancing the applications of industry 4.0 in real time.
Topics included for this special issue but not limited to the following:
- Artificial intelligence-based failure management techniques in integrated optoelectronic devices for industry 4.0
- Integrated optoelectronics devices reliability assessment for applications in the telecommunication industry
- Trends of integrated optoelectronic sensors and IoT for medical applications in real-time
- Advanced integrated optoelectronic device design and manufacturing for industry 4.0 and failure mitigation
- Machine learning in optoelectronic devices for automated fault detection and diagnosis for industry 4.0
- Intelligent optoelectronic device applications in equipment health prediction, preventive maintenance for smart factory
- Modern approaches of micro or nano-based integrated optoelectronic device applications for industry 4.0
- AI enabled-optoelectronic device applications in the robotic vision for industry 4.0
- Integrated optoelectronic devices: breakthroughs in complex failure analysis, concepts, techniques, precision
- Challenges and opportunities of technologies in quantum optoelectronic devices-based earlier failure analysis for next-generation industry 4.0
Important Dates:
Open for submissions: 1 June 2023
Submission Deadline: 30 June 2024
Guest Editors:
Dr. Manimurugan S, University of Tabuk, Tabuk City, Saudi Arabia
manimurugan@ut.edu.sa (this opens in a new tab)
Dr. Paulo Antunes, University of Aveiro, Portugal
pantunes@ua.pt (this opens in a new tab)
Dr. Jose Alfredo Alvarez-Chavez, University of Twente, The Netherlands
j.a.alvarezchavez@utwente.nl (this opens in a new tab)
Submission Information:
The submitted article must be original, unpublished and not currently reviewed by other journals. Authors must mention in their cover letter for each Special Issue manuscript that the particular manuscript is for the theme and name of Guest Editors of Special Issue consideration so that the Guest Editors can be notified separately. Please visit https://submission.nature.com/new-submission/11082/3 (this opens in a new tab), when submitting your paper and, in the Detail tab in the Collections dropdown list, choose "Integrated Optoelectronic Devices"
Published articles will be found here (this opens in a new tab).