Editors

Editor-in-Chief:

C. Barry Carter, University of Connecticut, Storrs, CT, United States of America

Deputy Editors-in-Chief:

Christopher F. Blanford, The University of Manchester, Manchester, United Kingdom

M. Grant Norton, Washington State University, Pullman, WA, United States of America

Editors:

Scott Beckman, Washington State University, Pullman, WA, United States of America

Kyle S. Brinkman, Clemson University, Clemson, SC, United States of America

Pedro Camargo, University of Helsinki, Helsinki, Finland

David P. Cann, Oregon State University, Corvallis, OR, United States of America

Catalin Croitoru, Transilvania University of Brasov, Brasov, Romania

Andréa SS De Camargo, Federal Institute for Materials Research and Testing (BAM), Berlin, Germany

Stephen J. Eichhorn, University of Bristol, Bristol, United Kingdom

Till Frömling, Technische Universität Darmstadt, Darmstadt, Germany 

Jean-François Gohy, Université Catholique de Louvain, Louvain, Belgium

Jaime Grunlan, Texas A&M University, College Station, TX, United States of America

Nima Haghdadi, Imperial College London, London, United Kingdom

Dale L. Huber, Sandia National Laboratories, Albuquerque, NM, United States of America

Maude Jimenez, University of Lille, Villeneuve d'Ascq, France

Kevin Jones, University of Florida, Gainesville, FL, United States of America

Yi David Ju, Royal Melbourne Institute of Technology, Melbourne, Victoria, Australia

Megumi Kawasaki, Oregon State University, Corvallis, OR, United States of America

Steven E. Naleway, University of Utah, Salt Lake City, UT, United States of America

Mohammad Naraghi, Texas A&M University, College Station, TX, United States of America

Philip Nash, University of Arizona, Tuscon, AZ, United States of America and Tianjin, China

Ghanshyam Pilania, Los Alamos National Laboratory, Los Alamos, NM, United States of America

Sophie Primig, University of New South Wales, Sydney, Australia

Subha Rath, Indian Institute of Technology Hyderabad, Sangareddy, India

N. Ravishankar, Indian Institute of Science, Bangalore, India

Greg Rutledge, Massachusetts Institute of Technology, Cambridge, MA, United States of America

Annela M. Seddon, Bristol University, Bristol, United Kingdom

Zhao Shen, Shanghai Jiao Tong University, Shanghai, China

Naiqin Zhao, Tianjin University, Tianjin, China

Peiyao Zhao, Tsinghua University,  Beijing, China

Invited Reviews Editor:

Philip Nash, Illinois Institute of Technology, Chicago, IL, United States of America

Outreach Editors:

Gang Liu, Xi’an Jiaotong University, Xi’an, China

Tiejun Zhu, Zhejiang University, Hangzhou, China

Editorial Board:

William Bonfield, (Chairman) University of Cambridge, United Kingdom

R. Abbaschian, University of California, Riverside, CA, USA; E. Baer, Case Western Reserve University, Cleveland, OH, USA; A.K. Bhowmick, University of Houston, Houston, USA; A. Boccaccini, University of Erlangen-Nuremberg, Germany; W. C. Carter, Massachusetts Institute of Technology, Cambridge, MA, USA; K. Chattopadhyay, Indian Institute of Science, Bangalore, India; K. Chawla, University of Alabama at Birmingham, USA; R.F. Cook, Winterville, NC, USA; G. Eggeler, Institut fur Werkstoffe, Bochum, Germany; J. H. Evans-Freeman, University of Canterbury, Canterbury, NZ; L.C. Feldman, Rutgers University, Piscataway, NJ, USA; D. Fray, University of Cambridge, UK; R. W. Grimes, Imperial College, London, UK; Y. Ikuhara, University of Tokyo, JFCC-Nagoya, and Tohoku University, Japan; W.D. Kaplan, Technion-Israel Institute of Technology, Haifa, Israel; H.S. Kim, POSTECH, Pohang, South Korea; K. Krishnan, University of Washington, Seattle, USA; T.G. Langdon, University of Southampton, UK; Y-W Mai, The University of Sydney, Australia; Z. Munir, University of California, Davis, CA; T.F. Page, University of Newcastle upon Tyne, UK; E. Rabkin, Technion- Israel Institute of Technology, Haifa, Israel; R. O. Ritchie, University of California, Berkeley, CA, USA; C. Russel, Friedrich-Schiller-University, Jena, Germany; H. Saka, Nagoya University, Japan; G. Solórzano, Pontificia Universidade Católica (PUC) Rio de Janeiro, Brazil; A.C. Taylor, Imperial College, London, UK; Z.L. Wang, Georgia Institute of Technology, Atlanta, USA; A.F.W. Willoughby, University of Southampton, UK; Yujie Xiong, USTC, Hefei, China; R.J. Young, The University of Manchester, UK; Y.T. Zhu, City University of Hong Kong, Kowloon, Hong Kong