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Editors

Editor-in-Chief
Andrew Kusiak, University of Iowa, USA

Regional Associate Editors
Asia
Manoj Kumar Tiwari, National Institute of Industrial Engineering, India

Europe
Hervé Panetto
, University of Lorraine, France

Associate Editors
Aditya Balu, 
Iowa State University, USA
Ahmad Barari, University of Ontario Institute of Technology, Canada
José A. Barata de Oliveira, Universidade Nova de Lisboa, Portugal
Eric Bonjour, University of Lorraine, France
Paolo Bosetti, University of Trento, Italy
Yuval Cohen, Afeka College of Engineering, Israel
Shichang Du, Shanghai Jiao Tong University, China
Maurizio Faccio, University of Padua, Italy
Ke Feng, Xi'an Jiaotong University, China
David He, University of Illinois at Chicago, USA
Laura García Hernández, University of Córdoba, Spain
Duck Young Kim, Pohang University of Science and Technology, South Korea
Minna Lanz, Tampere University, Finland
Vincent Lee, Monash University, Australia
Paulo Leitão, Polytechnic Institute of Bragança, Portugal
Jiewu Leng, Guangdong University of Technology, China
Xiaochun Li, University of California, Los Angeles, USA
Chun-Cheng Lin, National Yang Ming Chiao Tung University, Taiwan
Ang Liu, University of New South Wales, Australia
Chenang Liu, Oklahoma State University, USA
Yang Liu, Linköping University, Sweden
Marco Macchi, Politecnico di Milano, Italy
Kamal Medjaher, École Nationale d'Ingénieurs de Tarbes, France
Jörn Mehnen, University of Strathclyde, UK
Aydin Nassehi, University of Bristol, UK
Mirjana Pejić Bach, University of Zagre, Croatia
Ercan Oztemel, Marmara University, Turkey
J. Dinesh Peter, Karunya Institute of Technology & Sciences, India
Julius Pfrommer, Fraunhofer Institute of Optronics, System Technologies and Image Exploitation, Germany
Francesco Pistolesi, University of Pisa, Italy
Wei Qin, Shanghai Jiao Tong University, China
Fabio Sgarbossa, Norwegian University of Science and Technology, Norway
Vishal S. Sharma, University of the Witwatersrand, South Africa
Jing Shi, University of Cincinnati, USA
Zhe Song, Nanjing University, China
Marco Sortino, University of Udine, Italy
Sebastian Thiede, University of Twente, The Netherlands
Jiafu Wan, South China University of Technology, China
Chao Wang, University of Iowa, USA
Hao (Victor) Wang, National University of Singapore, Singapore
Juite (Ray) Wang, National Chung Hsing University, Taiwan
Peng (Edward) Wang, University of Kentucky, USA
Dazhong Wu, University of Central Florida, USA
Jianguo Wu, Peking University, China
Min Xia, Western University, Canada
Hao Yi, Chongqing University, China
Keping Yu, Hosei University, Japan
Xiaowei Yue, Virginia Tech, USA
Tong Zhang, South China University of Technology, China
Wen-Jun (Chris) Zhang, University of Saskatchewan, Canada
Kit Qichun Zhang, University of Bradford, UK
Yunbo (Will) Zhang, Rochester Institute of Technology, USA
Lin Zhang, Beihang University, China
Zijun Zhang, City University of Hong Kong, China
Pai Zheng, Hong Kong Polytechnic University, China
Shiyu Zhou, University of Wisconsin, USA

International Editorial Board:
Bruno Agard, Polytechnique Montréal, Canada
Thomas Bäck, Leiden University, The Netherlands
Abdelaziz Bouras, Qatar University, Qatar
Felix Chan, Macau University of Science and Technology, Macau
Yong Chen, University of Southern California, USA
Karthick P. Gunasekaran, Amazon, USA
Satyandra K. Gupta, University of Southern California, USA
Christoph Herrmann, Technische Universität Braunschweig, Germany
Thomas Kurfess, Oak Ridge National Laboratory, USA
Annalisa Milella, National Research Council of Italy, Italy
Charles Møller, Aalborg University, Denmark
Ilkyeong Moon, Seoul National University, South Korea
Kenichi Nakashima, Waseda University, Japan
John Pang, Nanyang Technological University, Singapore
David Romero, Tecnológico de Monterrey, México
Subhrajit Roychowdhury, General Electric, USA
Essam Shehab, Cranfield University, UK
Alexander Smirnov, Russian Academy of Sciences, Russia
Marcos Tsuzuki, Polytechnic School of the University of São Paulo, Brazil
Lianyu Zheng, Beihang University, China

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